"A Prescription for THz Transistor Characterization"
An on-wafer measurement tutorial narrated in Power-Point with embedded references.
D.F. Williams, "Traveling Waves and Power Waves," IEEE Microwave Magazine, Dec. 2013.
D.F. Williams, P. Corson, J. Sharma, H. Krishnaswamy, W. Tai, Z. George, D. Ricketts, P. Watson, E. Dacquay, and S. Voinigescu, "Calibration-kit design for millimeter-wave silicon integrated circuits," submitted to IEEE Trans. Microwave Theory and Tech.
D.F. Williams, A.C. Young, and M. Urteaga, "A prescription for sub-millimeter-wave transistor characterization," submitted to IEEE Trans. Terahertz Sci. and Technol.
Hale, P.D., Williams, D.F., Dienstfrey, A., Wang, J., Jargon, J., Humphreys, D., Harper, M., Fuser, H., Bieler, M., "Traceability of high-speed electrical waveforms at NIST, NPL, and PTB," Conference on Precision Electromagnetic Measurements, pp. 522-523, 2012.
J.A. Jargon, D.F. Williams, T.M. Wallis, D.X. LeGolvan, P.D. Hale, "Establishing traceability of an electronic calibration unit using the NIST Microwave Uncertainty Framework," 79th ARFTG Microwave Measurements Conference, pp. 1-5, 2012.
F.J. Schmuckle, R. Doerner, G.N. Phung, W.A. Heinrich, D.F. Williams, U. Arz, "Radiation, multimode propagation, and substrate modes in W-band CPW calibration," 41st European Microwave Conference, pp. 297-300, Oct. 2011. (Winner European Microwave Prize)
Jargon, J.A., Williams, D.F., Wallis, T.M., LeGolvan, D.X., Hale, P.D., "Establishing traceability of an electronic calibration unit using the NIST Microwave Uncertainty Framework," 2012 79th ARFTG Microwave Measurements Conference, pp. 1-5, June 2012.
D.F. Williams, "Rectangular-waveguide vector-network-analyzer calibrations with imperfect test ports," 76th ARFTG Microwave Measurement Symposium, pp. 1-8, Dec. 2010. (winner Best Paper Award)
N.M. Ridler, R.A. Ginley, J.L. Hesler, A.R. Kerr, R.D. Pollard and D.F. Williams, "Towards standardized waveguide sizes and interfaces for submillimeter wavelengths," 21st Int. Symp. Space Therahertz Technol., Oxford, 23-25 March 2010.
A. Lewandowski, W. Waitr, D. Williams, "Multi-frequency approach to vector-network-analyzer scattering-parameter measurements," 2010 European Microwave Conference, pp. 260-263, 28-30 Sept. 2010.
D.F. Williams, A. Lewandowski, D. LeGolvan, R. Ginley, C.M. Wang and J. Splett, "Use of Electronic Calibration Units for Vector-Network-Analyzer Verification," 74th ARFTG Microwave Measurement Conference, Boulder, Colorado, Dec. 1-4, 2009.
A. Lewandowski and D.F. Williams, "Stochastic modeling of coaxial-connector repeatability errors," 74th ARFTG Microwave Measurement Conference, Boulder, Colorado, Dec. 1-4, 2009.
P.D. Hale, D.F. Williams, A. Dienstfrey, C.M. Wang, A. Lewandowski, T.S. Clement, D. Keenan, "Complete waveform characterization at NIST," Precision Electromagnetic Measurements Digest, 2008, pp. 680-681, 2008.
A. Lewandowski and D.F. Williams, "Characterization and modeling of random vector network analyzer measurement errors," 17th International Conf. on Microwaves, Radar and Wireless Communications, 19-21 May, 2008.
D.F. Williams, T.S. Clement, P.D. Hale, and A. Dienstfrey, "Terminology for high-speed sampling-oscilloscope calibration," ARFTG Conf. Dig., pp. 9-14, Dec. 2006. (Best Paper Award)
D.F. Williams, C.M. Wang, U. Arz, "In-Phase/Quadrature Covariance-Matrix Representation of the Uncertainty of Vectors and Complex Numbers," ARFTG Conf. Dig., Dec. 2006.
D.F. Williams, C.M. Wang, and U. Arz, "An optimal multiline TRL calibration algorithm," 2003 Int. Microwave Symp. Dig., pp. 1819-1822, June 10-12, 2003.