"A Prescription for THz Transistor Characterization"
An on-wafer measurement tutorial narrated in Power-Point with embedded references.
D.F. Williams, "Traveling Waves and Power Waves," IEEE Microwave Magazine, Dec. 2013.
D.F. Williams, P. Corson, J. Sharma, H. Krishnaswamy, W. Tai, Z. George, D. Ricketts, P. Watson, E. Dacquay, and S. Voinigescu, "Calibration-kit design for millimeter-wave silicon integrated circuits," submitted to IEEE Trans. Microwave Theory and Tech.
D.F. Williams, A.C. Young, and M. Urteaga, "A prescription for sub-millimeter-wave transistor characterization," submitted to IEEE Trans. Terahertz Sci. and Technol.
Hale, P.D., Williams, D.F., Dienstfrey, A., Wang, J., Jargon, J., Humphreys, D., Harper, M., Fuser, H., Bieler, M., "Traceability of high-speed electrical waveforms at NIST, NPL, and PTB," Conference on Precision Electromagnetic Measurements, pp. 522-523, 2012.
J.A. Jargon, D.F. Williams, T.M. Wallis, D.X. LeGolvan, P.D. Hale, "Establishing traceability of an electronic calibration unit using the NIST Microwave Uncertainty Framework," 79th ARFTG Microwave Measurements Conference, pp. 1-5, 2012.
F.J. Schmuckle, R. Doerner, G.N. Phung, W.A. Heinrich, D.F. Williams, U. Arz, "Radiation, multimode propagation, and substrate modes in W-band CPW calibration," 41st European Microwave Conference, pp. 297-300, Oct. 2011. (Winner European Microwave Prize)
Jargon, J.A., Williams, D.F., Wallis, T.M., LeGolvan, D.X., Hale, P.D., "Establishing traceability of an electronic calibration unit using the NIST Microwave Uncertainty Framework," 2012 79th ARFTG Microwave Measurements Conference, pp. 1-5, June 2012.
N.M. Ridler, R.A. Ginley, J.L. Hesler, A.R. Kerr, R.D. Pollard and D.F. Williams, "Towards standardized waveguide sizes and interfaces for submillimeter wavelengths," 21st Int. Symp. Space Therahertz Technol., Oxford, 23-25 March 2010.
D.F. Williams, A. Lewandowski, D. LeGolvan, R. Ginley, C.M. Wang and J. Splett, "Use of Electronic Calibration Units for Vector-Network-Analyzer Verification," 74th ARFTG Microwave Measurement Conference, Boulder, Colorado, Dec. 1-4, 2009.
P.D. Hale, D.F. Williams, A. Dienstfrey, C.M. Wang, A. Lewandowski, T.S. Clement, D. Keenan, "Complete waveform characterization at NIST," Precision Electromagnetic Measurements Digest, 2008, pp. 680-681, 2008.
A. Lewandowski and D.F. Williams, "Characterization and modeling of random vector network analyzer measurement errors," 17th International Conf. on Microwaves, Radar and Wireless Communications, 19-21 May, 2008.