Measuring the Frequency Response of Gigabit Chip Photodiodes

Published

September 1, 2001

Author(s)

Paul D. Hale, Tracy S. Clement, Dylan F. Williams, E. Balta, N. D. Taneja

Abstract

We describe a calibratin and measurement procedure for determining the intrinsic frequency response fo gigabit chip photodiodes embedded in simple test fixtures. The procedure is unique because we make the measurements in the time-domain using a calibrated oscilloscope and we then apply frequency domain mismatch corrections to remove the effects of the fixture, bias tee, and cables from the measurements. WE demonstrate the procedure on photodiodes with an active region of approximately 150 m diameter excited by short 800 nm optical pulses.

Citation

Journal of Lightwave Technology

Volume

19

Issue

9

Pub Type

Journals

Download Paper

DOI Link

Keywords

frequency response, impulse response, Norton equivalent current, photodiode, Theivenin equivalent voltage

Citation

Hale, P. , Clement, T. , Williams, D. , Balta, E. and Taneja, N. (2001), Measuring the Frequency Response of Gigabit Chip Photodiodes, Journal of Lightwave Technology, [online], https://doi.org/10.1109/50.948281 (Accessed January 16, 2025)