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Electronics

In the realm of electrons and light, NIST provides the standards, develops the instruments and performs the calibrations necessary to keep both the smallest electronic components and the largest power grids running smoothly and safely.

orange patterned background with two candy corn-looking peaks and whiter ridges around the peaks

New Research Center to Explore Spintronics Materials for Advanced Computing
Man holding a NIST on a Chip device

For All Times, For All Peoples: How Replacing the Kilogram Empowers Industry (blog post)
multicolor image of an intel 2nd generation core microprocessor

Industry Impacts: Semiconductor Thin Film Design Optimization

Next-Generation Chips Require Multiple Measurement Approaches

Illustration: Computer chip in middle; surrounded by images of different scanning techniques
Credit: G. Orji and B. Barnes/NIST
Measurement science—or metrology—is critically important in computer chips, from design to manufacturing and quality control.

The metrology requirements for next-generation computer chips are stringent and specialized. No single instrument has the speed and sensitivity that’s needed to characterize a host of complex material parameters and measure all of a chip’s dimensions—the tiny sizes and distances between its various features.

Learn more about NIST's work in this space.

News and Updates

Industry Impacts

Projects and Programs

Field Parameter Metrology

Consider the consequences if nearby electronics could interfere with a jet's instruments or cause an automobile to stall. The Field Parameter Metrology Program

Publications

Cryogenic Calibration of the RF Josephson Arbitrary Waveform Synthesizer

Author(s)
Justus A. Brevik, Alirio De Jesus Soares Boaventura, Akim Babenko, Manuel C. Castellanos Beltran, Nathan E. Flowers-Jacobs, Anna E. Fox, Peter F. Hopkins, Paul D. Dresselhaus, Dylan F. Williams, Samuel P. Benz
We performed a preliminary calibrated measurement of the output power of a Josephson arbitrary waveform synthesizer up to 1 GHz.We present the results and

Dual Josephson Impedance Bridge: Universal bridge for impedance metrology

Author(s)
Frederic Overney, Nathan E. Flowers-Jacobs, Blaise Jeanneret, Alain Rufenacht, Anna E. Fox, Paul D. Dresselhaus, Samuel P. Benz
This paper describes the results of the calibration of a 100 pF capacitance standard performed at 1233 Hz. Two calibration chains were used. The classical

Software

On-Wafer Calibration Software

NIST Microwave Uncertainty Framework (Beta version) The NIST Microwave Uncertainty Framework provides a "drag-and-drop" toolkit for managing the calculation of

Timebase Correction Software

The Timebase Correction (TBC) software package , used with high-speed sampling oscilloscopes, can correct both random and systematic timebase errors using

Tools and Instruments

MBE Facility

Molecular Beam Epitaxy (MBE) Facility

The Applied Physics Division utilizes a fully automated, dual-chamber molecular beam epitaxy (MBE) system for the growth of advanced, compound semiconductor
Nanocalorimeter Measurement System

Nanocalorimeter Measurement System

This Nanocalorimeter Measurement System is used for nanocalorimetry measurements at fast heating rates (100 °C/s to 100,000 °C/s) and measurements of samples

Awards

Featured Videos

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