Projects/Programs

Displaying 1 - 25 of 84

$Schematics and diffraction patterns$

Aberration-corrected scanning transmission electron microscopy

Ongoing

Provide atomic resolution imaging and analysis of complex materials and devices, while also advancing transmission electron microscopy methods.

AC-DC Difference

Ongoing

The NIST Ac-dc 2 Difference Project performs leading edge measurement services and research for ac-dc difference measurements and dc voltage metrology. We

Photograph depicting IC manufacturing showing glowing squares on a round wafer, with a yellow triangular warning indicator labeled UV.

Advanced IC Interconnects - Process Metrology and Models

Ongoing

The objective for Advanced IC Interconnects is to provide measurement standards and advanced measurement methods supporting metrology needs of the semiconductor

Advanced Materials: Elemental and Chemical Analysis of Microstructured Materials

Ongoing

Electron, ion and photon-based microanalysis methods, instrumentation and protocols are developed to advance measurement science towards the elemental and

Advanced Materials Metrology

Ongoing

In this project we measure the fundamental electrical properties of materials from bulk to nanoscale from 1 MHz to 0.3 THz. Understanding the interaction of

Cross section of a SAC solder joint in a BGA, with sketches of potential micro specimens

Advanced Mechanical Characterization of Mesoscale Materials

Ongoing

We develop methods to evaluate the mechanical behavior of micro- and mesoscale metal alloys to fracture, and Micro Electro Mechanical Systems (MEMS) materials

Advanced Microwave Photonics

Ongoing

Research on quantum information (QI) seeks to control and exploit exotic properties of quantum mechanics, and researchers are already generating "unbreakable"

Micrographs of kinetic inductance-based parametric amplifier

Amplifiers

Ongoing

To process information from quantum circuits and systems, it is important to have amplifiers with wide bandwidth, high dynamic range, and extremely low noise

$Four examples of Transmission electron diffraction patterns obtained in a scanning electron microscope.$

Analytical Scanning Transmission Electron Microscopy in a Scanning Electron Microscope (STEM-in-SEM)

Ongoing

Transmission electron imaging and diffraction in an SEM are powerful tools that can be utilized in settings ranging from academia to small business, to

The NIST millimeter-wave extrapolation range being prepared for antenna measurements.

Antenna Metrology Project

Ongoing

Antennas are the eyes, ears and voice boxes of everything from cell phones to interplanetary spacecraft. The Antenna Metrology Program carries on NIST's

Chemical Functionalization and Manipulation of Nano Materials

Ongoing

This project focuses on understanding the potential for nanoscale engineered materials to advance state-of-the-art spectroscopic techniques and foster the

Degradation of extreme-ultraviolet optics

Ongoing

Optical systems that operate at wavelengths in the ultraviolet (UV) and extreme-ultraviolet (EUV) are susceptible to degradation by a number of different

Dynamic EUV Imaging and Spectroscopy for Microelectronics

Ongoing

The Dynamic EUV Imaging and Spectroscopy for Microelectronics program in the Spin Electronics group makes use of an ultra-fast, coherent, extreme ultraviolet

Earth Energy Budget

Ongoing

The goal of this project is to extend and improve the measurements of the key climate record of the long-term balance between Earth absorption of solar energy

Electric Power Metrology and the Smart Grid

Ongoing

Our country's way of life depends on the electric power distribution system. Keeping the national electric grid in good working order -- and ensuring power is

Massively parallel wafer-level long-term reliability test system featuring 30 fully functioning mini probe stations each supporting 100 probe pins with all the supporting stress/measure electronics integrated (without cables).

Electrical Characterization of Nanoscale Electron Devices

Ongoing

The information economy – the modern economy that heavily dependent on information gathering, transmitting, processing, storing, utilizing and consuming is

Electromagnetic Field Strength Metrology

Ongoing

The Field Strength Metrology Project develops measurements of free-space electromagnetic (EM) emissions to help evaluate electronic interference of electronic

Electronic Biophysical Measurements

Ongoing

Chipscale electronic devices such as field-effect transistors (FETs) are being developed for biochemical applications ranging from clinical diagnostics to

Electronic Material Characterization

Ongoing

To provide the necessary information for electronic material manufacturers to predict how and when failures will occur and enable lifetime analysis appropriate

Electronic Structure and Dynamics in Quantum Materials

Ongoing

Electronic structure information obtained with photoemission-based measurements provides a keystone in understanding emerging materials with potential

Engineering and Optical Characterization of Magnetic Nanoparticles (MNPs)

Ongoing

This project comprises of two complimentary components: 1.) the controlled synthesis of selectively engineered magnetic nanoparticles (MNPs) in support of the

Extreme Atom Probe Tomography

Ongoing

NIST is engaged in a joint effort between the Material Measurement Laboratory (MML) and the Physical Measurement Laboratory (PML) aimed at revolutionizing 3D

Extreme ultraviolet optical constants

Ongoing

In the vacuum ultraviolet and extreme ultraviolet (EUV), the indices of refraction of all materials become complex: N = n + ik , or N = 1- d + ik . Here, n is

Farad and Impedance Metrology

Ongoing

This project aims to provide the world's best basis for accurate impedance measurements by tying the U.S. legal system of electrical units to the International

Fatigue in Silicon

Ongoing

Our objective is to evaluate mechanisms of fatigue in bulk silicon, a material that has been traditionally considered to be immune to degradation of mechanical

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---Chemical Sciences Division
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