Projects/Programs

Displaying 1 - 25 of 66

Chemical Functionalization and Manipulation of Nano Materials

This project focuses on understanding the potential for nanoscale engineered materials to advance state-of-the-art spectroscopic techniques and foster the

AC-DC Difference

The NIST Ac-dc2 Difference Project performs leading edge measurement services and research for ac-dc difference measurements and dc voltage metrology. We

Advanced High Frequency Devices

The Advanced High Frequency Devices Program develops measurement methods to determine the characteristics of advanced electronics and devices at high

Advanced IC Interconnects - Process Metrology and Models

The objective for Advanced IC Interconnects is to provide measurement standards and advanced measurement methods supporting metrology needs of the semiconductor

Advanced Materials: Elemental and Chemical Analysis of Microstructured Materials

Electron, ion and photon-based microanalysis methods, instrumentation and protocols are developed to advance measurement science towards the elemental and

Advanced Materials Metrology

In this project we measure the fundamental electrical properties of materials from bulk to nanoscale from 1 MHz to 0.3 THz. Understanding the interaction of

Cross section of a SAC solder joint in a BGA, with sketches of potential micro specimens

Advanced Mechanical Characterization of Mesoscale Materials

Conventional mechanical test methods face limitations when specimens are smaller than a few millimeters in length, but information at this scale is needed for

Advanced Microwave Photonics

Research on quantum information (QI) seeks to control and exploit exotic properties of quantum mechanics, and researchers are already generating "unbreakable"

Amplifiers

To process quantum information it is important to have amplifiers with wide bandwidth, high dynamic range, and low noise.

$Four examples of Transmission electron diffraction patterns obtained in a scanning electron microscope.$

Analytical Transmission Scanning Electron Microscopy

This project develops STEM-in-SEM methods or low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to

The NIST millimeter-wave extrapolation range being prepared for antenna measurements.

Antenna Metrology

Antennas are the eyes, ears and voices of everything from cell phones to interplanetary spacecraft. The Antenna Metrology Program carries on PML's pioneering

Antenna Metrology - Near-Field Scanning

In the early 1970s, NIST researchers pioneered the near-field scanning technique, now the standard method for testing high-performance antennas designed to

Antenna Metrology Project

Antennas are the eyes, ears and voice boxes of everything from cell phones to interplanetary spacecraft. The Antenna Metrology Program carries on NIST's

ATOMIC ARRANGEMENTS AND STRUCTURE-PROPERTY RELATIONSHIPS

Provide reference materials and data, analysis and structure modeling protocols for the determination and prediction of atomic arrangements to enable innovation

Electric Power Metrology and the Smart Grid

Our country's way of life depends on the electric power distribution system. Keeping the national electric grid in good working order -- and ensuring power is

Massively parallel wafer-level long-term reliability test system featuring 30 fully functioning mini probe stations each supporting 100 probe pins with all the supporting stress/measure electronics integrated (without cables).

Electrical Characterization of Nanoscale Electron Devices

The information economy – the modern economy that heavily dependent on information gathering, transmitting, processing, storing, utilizing and consuming is

Electronic Biophysical Measurements

Chipscale electronic devices such as field-effect transistors (FETs) are being developed for biochemical applications ranging from clinical diagnostics to

Electronic Material Characterization

To provide the necessary information for electronic material manufacturers to predict how and when failures will occur and enable lifetime analysis appropriate

Electronic Structure and Dynamics in Quantum Materials

Electronic structure information obtained with photoemission-based measurements provides a keystone in understanding emerging quantum materials, and the unique

Engineering and Optical Characterization of Magnetic Nanoparticles (MNPs)

This project comprises of two complimentary components: 1.) the controlled synthesis of selectively engineered magnetic nanoparticles (MNPs) in support of the

Fabrication

The application of modern micro- and nanofabrication techniques to superconducting and cryogenic electronics is enabling new capabilities and applications.

Farad and Impedance Metrology

This project aims to provide the world's best basis for accurate impedance measurements by tying the U.S. legal system of electrical units to the International

Fatigue in Silicon

Our objective is to evaluate mechanisms of fatigue in bulk silicon, a material that has been traditionally considered to be immune to degradation of mechanical

Fiber Sources and Applications Background Information

Optical frequency combs convert a laser source containing a single frequency of light into pulses that include thousands of frequencies. This project aims to

Field Parameter Metrology

Consider the consequences if nearby electronics could interfere with a jet's instruments or cause an automobile to stall. The Field Parameter Metrology Program

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