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The NIST Ac-dc 2 Difference Project performs leading edge measurement services and research for ac-dc difference measurements and dc voltage metrology. We
The objective for Advanced IC Interconnects is to provide measurement standards and advanced measurement methods supporting metrology needs of the semiconductor
Electron, ion and photon-based microanalysis methods, instrumentation and protocols are developed to advance measurement science towards the elemental and
In this project we measure the fundamental electrical properties of materials from bulk to nanoscale from 1 MHz to 0.3 THz. Understanding the interaction of
We develop methods to evaluate the mechanical behavior of micro- and mesoscale metal alloys to fracture, and Micro Electro Mechanical Systems (MEMS) materials
Research on quantum information (QI) seeks to control and exploit exotic properties of quantum mechanics, and researchers are already generating "unbreakable"
To process information from quantum circuits and systems, it is important to have amplifiers with wide bandwidth, high dynamic range, and extremely low noise
Transmission electron imaging and diffraction in an SEM are powerful tools that can be utilized in settings ranging from academia to small business, to
Antennas are the eyes, ears and voice boxes of everything from cell phones to interplanetary spacecraft. The Antenna Metrology Program carries on NIST's
This project focuses on understanding the potential for nanoscale engineered materials to advance state-of-the-art spectroscopic techniques and foster the
Optical systems that operate at wavelengths in the ultraviolet (UV) and extreme-ultraviolet (EUV) are susceptible to degradation by a number of different
The Dynamic EUV Imaging and Spectroscopy for Microelectronics program in the Spin Electronics group makes use of an ultra-fast, coherent, extreme ultraviolet
The goal of this project is to extend and improve the measurements of the key climate record of the long-term balance between Earth absorption of solar energy
Our country's way of life depends on the electric power distribution system. Keeping the national electric grid in good working order -- and ensuring power is
The information economy – the modern economy that heavily dependent on information gathering, transmitting, processing, storing, utilizing and consuming is
The Field Strength Metrology Project develops measurements of free-space electromagnetic (EM) emissions to help evaluate electronic interference of electronic
Chipscale electronic devices such as field-effect transistors (FETs) are being developed for biochemical applications ranging from clinical diagnostics to
To provide the necessary information for electronic material manufacturers to predict how and when failures will occur and enable lifetime analysis appropriate
This project comprises of two complimentary components: 1.) the controlled synthesis of selectively engineered magnetic nanoparticles (MNPs) in support of the
NIST is engaged in a joint effort between the Material Measurement Laboratory (MML) and the Physical Measurement Laboratory (PML) aimed at revolutionizing 3D
In the vacuum ultraviolet and extreme ultraviolet (EUV), the indices of refraction of all materials become complex: N = n + ik , or N = 1- d + ik . Here, n is
This project aims to provide the world's best basis for accurate impedance measurements by tying the U.S. legal system of electrical units to the International
Our objective is to evaluate mechanisms of fatigue in bulk silicon, a material that has been traditionally considered to be immune to degradation of mechanical