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Projects/Programs

Displaying 1 - 25 of 66

AC-DC Difference

The NIST Ac-dc2 Difference Project performs leading edge measurement services and research for ac-dc difference measurements and dc voltage metrology. We

Advanced High Frequency Devices

The Advanced High Frequency Devices Program develops measurement methods to determine the characteristics of advanced electronics and devices at high

Advanced Materials Metrology

In this project we measure the fundamental electrical properties of materials from bulk to nanoscale from 1 MHz to 0.3 THz. Understanding the interaction of

Advanced Microwave Photonics

Research on quantum information (QI) seeks to control and exploit exotic properties of quantum mechanics, and researchers are already generating "unbreakable"

Amplifiers

To process quantum information it is important to have amplifiers with wide bandwidth, high dynamic range, and low noise.

Antenna Metrology

Antennas are the eyes, ears and voices of everything from cell phones to interplanetary spacecraft. The Antenna Metrology Program carries on PML's pioneering

Antenna Metrology Project

Antennas are the eyes, ears and voice boxes of everything from cell phones to interplanetary spacecraft. The Antenna Metrology Program carries on NIST's

Electronic Biophysical Measurements

Chipscale electronic devices such as field-effect transistors (FETs) are being developed for biochemical applications ranging from clinical diagnostics to

Electronic Material Characterization

To provide the necessary information for electronic material manufacturers to predict how and when failures will occur and enable lifetime analysis appropriate

Fabrication

The application of modern micro- and nanofabrication techniques to superconducting and cryogenic electronics is enabling new capabilities and applications.

Farad and Impedance Metrology

This project aims to provide the world's best basis for accurate impedance measurements by tying the U.S. legal system of electrical units to the International

Fatigue in Silicon

Our objective is to evaluate mechanisms of fatigue in bulk silicon, a material that has been traditionally considered to be immune to degradation of mechanical

Fiber Sources and Applications

Optical frequency combs convert a laser source containing a single frequency of light into pulses that include thousands of frequencies. This project aims to

Field Parameter Metrology

Consider the consequences if nearby electronics could interfere with a jet's instruments or cause an automobile to stall. The Field Parameter Metrology Program