Projects/Programs

Displaying 1 - 25 of 72

AC-DC Difference

Ongoing

The NIST Ac-dc2 Difference Project performs leading edge measurement services and research for ac-dc difference measurements and dc voltage metrology. We

Advanced IC Interconnects - Process Metrology and Models

Ongoing

The objective for Advanced IC Interconnects is to provide measurement standards and advanced measurement methods supporting metrology needs of the semiconductor

Advanced Materials: Elemental and Chemical Analysis of Microstructured Materials

Ongoing

Electron, ion and photon-based microanalysis methods, instrumentation and protocols are developed to advance measurement science towards the elemental and

Advanced Materials Metrology

Ongoing

In this project we measure the fundamental electrical properties of materials from bulk to nanoscale from 1 MHz to 0.3 THz. Understanding the interaction of

Cross section of a SAC solder joint in a BGA, with sketches of potential micro specimens

Advanced Mechanical Characterization of Mesoscale Materials

Ongoing

Conventional mechanical test methods face limitations when specimens are smaller than a few millimeters in length, but information at this scale is needed for

Advanced Microwave Photonics

Ongoing

Research on quantum information (QI) seeks to control and exploit exotic properties of quantum mechanics, and researchers are already generating "unbreakable"

Amplifiers

Ongoing

To process quantum information it is important to have amplifiers with wide bandwidth, high dynamic range, and low noise.

$Four examples of Transmission electron diffraction patterns obtained in a scanning electron microscope.$

Analytical Transmission Scanning Electron Microscopy

Ongoing

This project develops STEM-in-SEM methods or low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to

The NIST millimeter-wave extrapolation range being prepared for antenna measurements.

Antenna Metrology Project

Ongoing

Antennas are the eyes, ears and voice boxes of everything from cell phones to interplanetary spacecraft. The Antenna Metrology Program carries on NIST's

ATOMIC ARRANGEMENTS AND STRUCTURE-PROPERTY RELATIONSHIPS

Ongoing

Provide reference materials and data, analysis and structure modeling protocols for the determination and prediction of atomic arrangements to enable innovation

Chemical Functionalization and Manipulation of Nano Materials

Ongoing

This project focuses on understanding the potential for nanoscale engineered materials to advance state-of-the-art spectroscopic techniques and foster the

Dynamic EUV Imaging and Spectroscopy for Microelectronics

Ongoing

The Dynamic EUV Imaging and Spectroscopy for Microelectronics program in the Spin Electronics group makes use of an ultra-fast, coherent, extreme ultraviolet

Earth Energy Budget

Ongoing

The goal of this project is to extend and improve the measurements of the key climate record of the long-term balance between Earth absorption of solar energy

Electric Power Metrology and the Smart Grid

Ongoing

Our country's way of life depends on the electric power distribution system. Keeping the national electric grid in good working order -- and ensuring power is

Massively parallel wafer-level long-term reliability test system featuring 30 fully functioning mini probe stations each supporting 100 probe pins with all the supporting stress/measure electronics integrated (without cables).

Electrical Characterization of Nanoscale Electron Devices

Ongoing

The information economy – the modern economy that heavily dependent on information gathering, transmitting, processing, storing, utilizing and consuming is

Electromagnetic Field Strength Metrology

Ongoing

The Field Strength Metrology Project develops measurements of free-space electromagnetic (EM) emissions to help evaluate electronic interference of electronic

Electronic Biophysical Measurements

Ongoing

Chipscale electronic devices such as field-effect transistors (FETs) are being developed for biochemical applications ranging from clinical diagnostics to

Electronic Material Characterization

Ongoing

To provide the necessary information for electronic material manufacturers to predict how and when failures will occur and enable lifetime analysis appropriate

Electronic Structure and Dynamics in Quantum Materials

Ongoing

Electronic structure information obtained with photoemission-based measurements provides a keystone in understanding emerging quantum materials, and the unique

Engineering and Optical Characterization of Magnetic Nanoparticles (MNPs)

Ongoing

This project comprises of two complimentary components: 1.) the controlled synthesis of selectively engineered magnetic nanoparticles (MNPs) in support of the

Extreme Atom Probe Tomography

Ongoing

NIST is engaged in a joint effort between the Material Measurement Laboratory (MML) and the Physical Measurement Laboratory (PML) aimed at revolutionizing 3D

Fabrication

Ongoing

The application of modern micro- and nanofabrication techniques to superconducting and cryogenic electronics is enabling new capabilities and applications.

Farad and Impedance Metrology

Ongoing

This project aims to provide the world's best basis for accurate impedance measurements by tying the U.S. legal system of electrical units to the International

Fatigue in Silicon

Ongoing

Our objective is to evaluate mechanisms of fatigue in bulk silicon, a material that has been traditionally considered to be immune to degradation of mechanical

Fiber Sources and Applications Background Information

Ongoing

Optical frequency combs convert a laser source containing a single frequency of light into pulses that include thousands of frequencies. This project aims to

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