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Optoelectronics

News and Updates

A Better Way to Measure Acceleration

You’re going at the speed limit down a two-lane road when a car barrels out of a driveway on your right. You slam on the brakes, and within a fraction of a

Events

Projects and Programs

GaN Nanowire Growth

GaN nanowires grown by catalyst-free molecular beam epitaxy have the unique property that most nanowires are completely free of crystalline defects. This

Waveform Metrology Project

Today's economy relies on high-speed communications that ride fiber-optic networks, and CTL physicists play a crucial role in providing the means to test the

High-Power Laser Applications

High power lasers capable of continuous output powers ranging from hundreds of watts to tens-of-thousands of watts present exciting opportunities for rapid

Publications

The joint automated repository for various integrated simulations (JARVIS) for data-driven materials design

Author(s)
Kamal Choudhary, Kevin F. Garrity, Andrew C. Reid, Brian DeCost, Adam J. Biacchi, Angela Hight Walker, Zachary Trautt, Jason Hattrick-Simpers, Aaron Kusne, Andrea Centrone, Albert Davydov, Francesca Tavazza, Jie Jiang, Ruth Pachter, Gowoon Cheon, Evan Reed, Ankit Agrawal, Xiaofeng Qian, Vinit Sharma, Houlong Zhuang, Sergei Kalinin, Ghanshyam Pilania, Pinar Acar, Subhasish Mandal, David Vanderbilt, Karin Rabe
The Joint Automated Repository for Various Integrated Simulations (JARVIS) is an integrated infrastructure to accelerate materials discovery and design using

Software

On-Wafer Calibration Software

NIST Microwave Uncertainty Framework (Beta version) The NIST Microwave Uncertainty Framework provides a "drag-and-drop" toolkit for managing the calculation of

Tools and Instruments

Awards