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Electronics

Optoelectronics

News and Updates

Projects and Programs

Diagram showing our multidimensional spectroscopy experiment.

Femtosecond Nonlinear Optical Spectroscopy of Nanoscale Materials

Ongoing
The purpose of this project is to develop and refine spectroscopic techniques based on nonlinear optics for the study of novel materials. Measurements that isolate the nonlinear response are often better able to uncover physical processes that, in the linear response, are subtle and hard to isolate
nanowires

GaN Nanowire Metrology and Applications

Ongoing
GaN Nanowire LEDs: Our selective epitaxy methods and dopant characterization techniques have enabled fabrication of arrays of nanowire LEDs with controlled location and spatial layout. This development is complemented by modeling of the carrier flow and recombination. These LEDs were combined to
Schematic illustration of the integrated near-field optoelectronic (INFO) probe showing light emission, microwave reflection lines for measuring specimen conductivity and/or magnetization, and simultaneous contact topography feedback.  

Integrated Near-field Optoelectronic (INFO) Scanning Probe

Ongoing
In a collaboration between the Nanoelectromagnetics Project and the Quantitative Imaging Project, we have fabricated and tested a GaN nanowire mounted on an AFM tip as a near-field scanning microwave microscopy (NSMM ) tip (see Fig. 2(a) below ). A tungsten atomic layer deposition (ALD) coating
Planar absolute cryogenic radiometer with multiwall vertically-aligned carbon nanotubes. Superconducting transition-edge sensor. Fully-lithographic fabrication.

Photonic Radiometry

Ongoing
Meeting the needs of the photonics industry and anticipating emerging technologies requires investigation and development of improved measurement methods and instrumentation. This project develops state-of-art, absolute microfabricated thermal detectors with absorber coatings consisting of carbon

Publications

Electro-Optic Imaging Millimeter-Wave Propagation On-Wafer

Author(s)
Bryan Bosworth, Nick Jungwirth, Jerome Cheron, Franklyn Quinlan, Nate Orloff, Chris Long, Ari Feldman
We demonstrate an electro-optic imaging system for mmWaves propagating along a coplanar waveguide. Using dual optical frequency combs and a polarization

Studies of spatial uniformity and jitter in SiC UV SPADs

Author(s)
Joshua Bienfang, Edwin J. Heilweil, Anand Sampath, Gregory Garrett, Jonathan Shuster, Jeremy Smith, Michael Derenge, Daniel Habersat, Reza Gandhi, Sergei Dolinsky, Enrico Bellotti, michael wrabeck
Ultraviolet single-photon avalanche detectors (UV-SPAD) that are low cost, size, weight, and power as well as resilient to shock, high temperatures and stray

Software

On-Wafer Calibration Software

NIST Microwave Uncertainty Framework (Beta version) The NIST Microwave Uncertainty Framework provides a "drag-and-drop" toolkit for managing the calculation of

Tools and Instruments

Awards