Optoelectronics

News and Updates

As Good as it Gets: NIST Develops Its Fourth Generation Wire Micrometer that Rivals Best in the World

March 11, 2021

Researchers at the National Institute of Standards and Technology (NIST) have developed a dramatically improved laser-based instrument that measures the

A Better Way to Measure Acceleration

March 8, 2021

You’re going at the speed limit down a two-lane road when a car barrels out of a driveway on your right. You slam on the brakes, and within a fraction of a

Bringing Atoms to a Standstill: NIST Miniaturizes Laser Cooling

January 21, 2021

It’s cool to be small. Scientists at the National Institute of Standards and Technology (NIST) have miniaturized the optical components required to cool atoms

Events

19th International Workshop on Low Temperature Detectors (LTD19)

Mon, Jul 19 - Thu, Jul 29 2021

The 19th International Workshop on Low Temperature Detectors (LTD19) is an opportunity for researchers from around the

Projects and Programs

Femtosecond Nonlinear Optical Spectroscopy of Nanoscale Materials

Condensed matter dynamics can evolve on a subpicosecond timescale, too fast to follow using many characterization techniques. We use femtosecond optical pulses

GaN Nanowire Growth

GaN nanowires grown by catalyst-free molecular beam epitaxy have the unique property that most nanowires are completely free of crystalline defects. This

Waveform Metrology Project

Today's economy relies on high-speed communications that ride fiber-optic networks, and CTL physicists play a crucial role in providing the means to test the

High-Power Laser Applications

High power lasers capable of continuous output powers ranging from hundreds of watts to tens-of-thousands of watts present exciting opportunities for rapid

Publications

Low-noise photon counting above 100 million counts per second with a high-efficiency reach-through single-photon avalanche diode system

March 29, 2021

Author(s)

Michael Wayne, Joshua Bienfang, Alan L. Migdall

We demonstrate a method that allows a high-efficiency single-photon-avalanche diode (SPAD) with a thick absorption region (> 10 µm) to count single photons at

Experimental comparison of performance monitoring using neural networks trained with parameters derived from delay-tap plots and eye diagrams

January 25, 2021

Author(s)

Jeffrey Jargon, Xiaoxia Wu, Chih-Ming Wang, Alan Willner

We experimentally demonstrate the use of artificial neural networks trained with parameters derived from both delay-tap plots and eye diagrams for multi

Unraveling the compositional heterogeneity and carrier dynamics of alkali cation doped 3D/2D perovskites with improved stability

December 11, 2020

Author(s)

Ming Chun Tang, Siyuan Zhang, Nhan V. Nguyen, Edwin J. Heilweil, Christina A. Hacker, Timothy J. Magnanelli, Thomas D. Anthopoulos

Preventing the degradation of hybrid perovskite by humid air remains a challenge for their future commercial utilization. 3D/2D perovskites with hierarchical

The joint automated repository for various integrated simulations (JARVIS) for data-driven materials design

November 12, 2020

Author(s)

Kamal Choudhary, Kevin F. Garrity, Andrew C. Reid, Brian DeCost, Adam J. Biacchi, Angela Hight Walker, Zachary Trautt, Jason Hattrick-Simpers, Aaron Kusne, Andrea Centrone, Albert Davydov, Francesca Tavazza, Jie Jiang, Ruth Pachter, Gowoon Cheon, Evan Reed, Ankit Agrawal, Xiaofeng Qian, Vinit Sharma, Houlong Zhuang, Sergei Kalinin, Ghanshyam Pilania, Pinar Acar, Subhasish Mandal, David Vanderbilt, Karin Rabe

The Joint Automated Repository for Various Integrated Simulations (JARVIS) is an integrated infrastructure to accelerate materials discovery and design using

Software

On-Wafer Calibration Software

NIST Microwave Uncertainty Framework (Beta version) The NIST Microwave Uncertainty Framework provides a "drag-and-drop" toolkit for managing the calculation of

Tools and Instruments

Material Analysis Using Neutron Depth Profiling

Light elements such as helium, lithium, boron, and nitrogen are essential constituents in materials that enable energy technologies; lithium ion batteries

Optoelectronics

News and Updates

As Good as it Gets: NIST Develops Its Fourth Generation Wire Micrometer that Rivals Best in the World

A Better Way to Measure Acceleration

Bringing Atoms to a Standstill: NIST Miniaturizes Laser Cooling

Events

19th International Workshop on Low Temperature Detectors (LTD19)

Projects and Programs

Femtosecond Nonlinear Optical Spectroscopy of Nanoscale Materials

GaN Nanowire Growth

Waveform Metrology Project

High-Power Laser Applications

Publications

Low-noise photon counting above 100 million counts per second with a high-efficiency reach-through single-photon avalanche diode system

Experimental comparison of performance monitoring using neural networks trained with parameters derived from delay-tap plots and eye diagrams

Unraveling the compositional heterogeneity and carrier dynamics of alkali cation doped 3D/2D perovskites with improved stability

The joint automated repository for various integrated simulations (JARVIS) for data-driven materials design

Software

On-Wafer Calibration Software

Tools and Instruments

Material Analysis Using Neutron Depth Profiling

Awards

Sae Woo Nam Receives 2008 Arthur S. Flemming Award

Paul Boynton Receives 2008 William P. Slichter Award

Lehman, Cromer, and Li Receive 2008 FLC Technology Transfer Award

Igor Vayshenker Receives 2007 Allen V. Astin Award