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Optoelectronics

News and Updates

What Laser Color Do You Like?

Researchers at the National Institute of Standards and Technology (NIST) and the University of Maryland have developed a microchip technology that can convert

Projects and Programs

Nanostructure Synthesis

We synthesize semiconductor nanostructures to serve both as test structures for measurement techniques and as building blocks for novel metrology tools and

Photonic Radiometry

Accurate characterization of photonic equipment is important for optical communications, medical devices, semiconductor lithography, manufacturing and materials

Publications

Ultrafast waveform metrology: A first international comparison

Author(s)
Mark Bieler, Paul Struszewski, Ari D. Feldman, Jeffrey A. Jargon, Paul D. Hale, Pengwei Gong, Wen Xie, Chuntao Yang, Zhigang Feng, Kejia Zhao, Zhijun Yang
We report on the first international comparison in ultrafast waveform metrology. To this end, the frequency and time responses of a photodiode with a nominal

Software

On-Wafer Calibration Software

NIST Microwave Uncertainty Framework (Beta version) The NIST Microwave Uncertainty Framework provides a "drag-and-drop" toolkit for managing the calculation of

Tools and Instruments

Awards