Optoelectronics

News and Updates

What Laser Color Do You Like?

October 13, 2020

Researchers at the National Institute of Standards and Technology (NIST) and the University of Maryland have developed a microchip technology that can convert

cryogenically cooled laser microresonator frequency comb

Comb on a Chip: New Design for ‘Optical Ruler’ Could Revolutionize Clocks, Telescopes, Telecommunications

June 22, 2020

Just as a meter stick with hundreds of tick marks can be used to measure distances with great precision, a device known as a laser frequency comb, with its

What a Switch! NIST-Led Team Develops Tiny Low-Energy Device to Rapidly Reroute Light in Computer Chips

November 14, 2019

Researchers at the National Institute of Standards and Technology (NIST) and their colleagues have developed an optical switch that routes light from one

Table covered with lenses and other optical equipment, and a flat screen mounted high in the background showing a yellow squiggly line across the top and a spiky orange line below.

NIST Infrared Frequency Comb Measures Biological Signatures

June 7, 2019

Researchers at the National Institute of Standards and Technology (NIST) and collaborators have demonstrated a compact frequency-comb apparatus that rapidly

Projects and Programs

Femtosecond Nonlinear Optical Spectroscopy of Nanoscale Materials

Condensed matter dynamics can evolve on a subpicosecond timescale, too fast to follow using many characterization techniques. We use femtosecond optical pulses

Four examples of GaN nanostructures grown with selective epitaxy by molecular beam epitaxy, illustrating different morphology for Ga-polar vs. N-polar crystals.

Nanostructure Synthesis

We synthesize semiconductor nanostructures to serve both as test structures for measurement techniques and as building blocks for novel metrology tools and

Schematic illustration of the integrated near-field optoelectronic (INFO) probe showing light emission, microwave reflection lines for measuring specimen conductivity and/or magnetization, and simultaneous contact topography feedback.

Integrated Near-field Optoelectronic (INFO) Scanning Probe

Scanning probe technology is an essential tool for measuring nanostructure properties. A major goal in our project is to develop unique probes that combine

Planar absolute cryogenic radiometer with multiwall vertically-aligned carbon nanotubes. Superconducting transition-edge sensor. Fully-lithographic fabrication.

Photonic Radiometry

Accurate characterization of photonic equipment is important for optical communications, medical devices, semiconductor lithography, manufacturing and materials

Publications

Room temperature wideband tunable photoluminescence of pulsed thermally annealed layered black phosphorus

September 21, 2020

Author(s)

Sara A. Alodan, Justin M. Gorham, Frank W. DelRio, Fadhel Alsaffar, Ghadeer Aljalham, Chongwu Zhou, Moh R. Amer

Newly explored two-dimensional (2D) materials have shown promising optical properties, owning to the tunable band gap of the layered material with its thickness

Optical and Mechanical Design of a Telescope for Lunar Spectral Irradiance Measurements from a High-Altitude Aircraft

September 9, 2020

Author(s)

Clarence J. Zarobila, Steven E. Grantham, Steven W. Brown, John T. Woodward IV, Stephen E. Maxwell, Dana R. Defibaugh, Thomas C. Larason, Kevin Turpie

We have designed a non-imaging telescope for measurement of the spectral irradiance of the moon. The telescope was integrated into a wing pod of a NASA ER-2

Ultrafast waveform metrology: A first international comparison

August 24, 2020

Author(s)

Mark Bieler, Paul Struszewski, Ari D. Feldman, Jeffrey A. Jargon, Paul D. Hale, Pengwei Gong, Wen Xie, Chuntao Yang, Zhigang Feng, Kejia Zhao, Zhijun Yang

We report on the first international comparison in ultrafast waveform metrology. To this end, the frequency and time responses of a photodiode with a nominal

Photodiode Calibration Comparison between Electro-Optic Sampling and Heterodyne Measurements up to 75 GHz

August 24, 2020

Author(s)

Ari D. Feldman, Jeffrey A. Jargon, Tasshi Dennis, Paul D. Hale

We present the first-ever comparison of a photodiodes measured frequency response calibrated with an electro-optic sampling system and a heterodyne system up

Software

On-Wafer Calibration Software

NIST Microwave Uncertainty Framework (Beta version) The NIST Microwave Uncertainty Framework provides a "drag-and-drop" toolkit for managing the calculation of

Tools and Instruments

Material Analysis Using Neutron Depth Profiling

Light elements such as helium, lithium, boron, and nitrogen are essential constituents in materials that enable energy technologies; lithium ion batteries

Optoelectronics

News and Updates

What Laser Color Do You Like?

Comb on a Chip: New Design for ‘Optical Ruler’ Could Revolutionize Clocks, Telescopes, Telecommunications

What a Switch! NIST-Led Team Develops Tiny Low-Energy Device to Rapidly Reroute Light in Computer Chips

NIST Infrared Frequency Comb Measures Biological Signatures

Projects and Programs

Femtosecond Nonlinear Optical Spectroscopy of Nanoscale Materials

Nanostructure Synthesis

Integrated Near-field Optoelectronic (INFO) Scanning Probe

Photonic Radiometry

Publications

Room temperature wideband tunable photoluminescence of pulsed thermally annealed layered black phosphorus

Optical and Mechanical Design of a Telescope for Lunar Spectral Irradiance Measurements from a High-Altitude Aircraft

Ultrafast waveform metrology: A first international comparison

Photodiode Calibration Comparison between Electro-Optic Sampling and Heterodyne Measurements up to 75 GHz

Software

On-Wafer Calibration Software

Tools and Instruments

Material Analysis Using Neutron Depth Profiling

Awards

Sae Woo Nam Receives 2008 Arthur S. Flemming Award

Paul Boynton Receives 2008 William P. Slichter Award

Lehman, Cromer, and Li Receive 2008 FLC Technology Transfer Award

Igor Vayshenker Receives 2007 Allen V. Astin Award