Optoelectronics

News and Updates

Escape From Flatland: Calibration Method Enables Microscopes to Make Accurate Measurements in All 3 Dimensions

June 24, 2021

Conventional microscopes provide essential information about samples in two dimensions — the plane of the microscope slide. But flat is not all that. In many

Detecting mid-infrared light, one photon at a time

June 1, 2021

For some 30 years, scientists have used superconducting materials to record the tiniest specks of light imaginable — individual photons, or single particles of

As Good as it Gets: NIST Develops Its Fourth Generation Wire Micrometer that Rivals Best in the World

March 11, 2021

Researchers at the National Institute of Standards and Technology (NIST) have developed a dramatically improved laser-based instrument that measures the

Events

19th International Workshop on Low Temperature Detectors (LTD19)

Mon, Jul 19 - Thu, Jul 29 2021

The 19th International Workshop on Low Temperature Detectors (LTD19) is an opportunity for researchers from around the

Projects and Programs

Femtosecond Nonlinear Optical Spectroscopy of Nanoscale Materials

Condensed matter dynamics can evolve on a subpicosecond timescale, too fast to follow using many characterization techniques. We use femtosecond optical pulses

Super-Continuum Laser Solar Simulator

This research leverages a new laser technology, the super-continuum laser, to produce a programmable solar simulator that can rapidly configure to match nearly

Fiber Sources and Applications

Optical frequency combs convert a laser source containing a single frequency of light into pulses that include thousands of frequencies. This project aims to

Passive millimeter-wave image of concealed contraband (handgun and ceramic knife).

Terahertz Imaging and Sources

Imaging in the terahertz frequency range enables the detection of concealed weapons and other contraband (e.g., explosives under clothing) without the use of

Publications

Low-noise photon counting above 100 million counts per second with a high-efficiency reach-through single-photon avalanche diode system

March 29, 2021

Author(s)

Michael Wayne, Joshua Bienfang, Alan L. Migdall

We demonstrate a method that allows a high-efficiency single-photon-avalanche diode (SPAD) with a thick absorption region (> 10 µm) to count single photons at

Experimental comparison of performance monitoring using neural networks trained with parameters derived from delay-tap plots and eye diagrams

January 25, 2021

Author(s)

Jeffrey Jargon, Xiaoxia Wu, Chih-Ming Wang, Alan Willner

We experimentally demonstrate the use of artificial neural networks trained with parameters derived from both delay-tap plots and eye diagrams for multi

Unraveling the compositional heterogeneity and carrier dynamics of alkali cation doped 3D/2D perovskites with improved stability

December 11, 2020

Author(s)

Ming Chun Tang, Siyuan Zhang, Nhan V. Nguyen, Edwin J. Heilweil, Christina A. Hacker, Timothy J. Magnanelli, Thomas D. Anthopoulos

Preventing the degradation of hybrid perovskite by humid air remains a challenge for their future commercial utilization. 3D/2D perovskites with hierarchical

The joint automated repository for various integrated simulations (JARVIS) for data-driven materials design

November 12, 2020

Author(s)

Kamal Choudhary, Kevin Garrity, Andrew C. Reid, Brian DeCost, Adam Biacchi, Angela R. Hight Walker, Zachary Trautt, Jason Hattrick-Simpers, Aaron Kusne, Andrea Centrone, Albert Davydov, Francesca Tavazza, Jie Jiang, Ruth Pachter, Gowoon Cheon, Evan Reed, Ankit Agrawal, Xiaofeng Qian, Vinit Sharma, Houlong Zhuang, Sergei Kalinin, Ghanshyam Pilania, Pinar Acar, Subhasish Mandal, David Vanderbilt, Karin Rabe

The Joint Automated Repository for Various Integrated Simulations (JARVIS) is an integrated infrastructure to accelerate materials discovery and design using

Software

On-Wafer Calibration Software

NIST Microwave Uncertainty Framework (Beta version) The NIST Microwave Uncertainty Framework provides a "drag-and-drop" toolkit for managing the calculation of

Tools and Instruments

Material Analysis Using Neutron Depth Profiling

Light elements such as helium, lithium, boron, and nitrogen are essential constituents in materials that enable energy technologies; lithium ion batteries

Optoelectronics

News and Updates

Escape From Flatland: Calibration Method Enables Microscopes to Make Accurate Measurements in All 3 Dimensions

Detecting mid-infrared light, one photon at a time

As Good as it Gets: NIST Develops Its Fourth Generation Wire Micrometer that Rivals Best in the World

Events

19th International Workshop on Low Temperature Detectors (LTD19)

Projects and Programs

Femtosecond Nonlinear Optical Spectroscopy of Nanoscale Materials

Super-Continuum Laser Solar Simulator

Fiber Sources and Applications

Terahertz Imaging and Sources

Publications

Low-noise photon counting above 100 million counts per second with a high-efficiency reach-through single-photon avalanche diode system

Experimental comparison of performance monitoring using neural networks trained with parameters derived from delay-tap plots and eye diagrams

Unraveling the compositional heterogeneity and carrier dynamics of alkali cation doped 3D/2D perovskites with improved stability

The joint automated repository for various integrated simulations (JARVIS) for data-driven materials design

Software

On-Wafer Calibration Software

Tools and Instruments

Material Analysis Using Neutron Depth Profiling

Awards

Sae Woo Nam Receives 2008 Arthur S. Flemming Award

Paul Boynton Receives 2008 William P. Slichter Award

Lehman, Cromer, and Li Receive 2008 FLC Technology Transfer Award

Igor Vayshenker Receives 2007 Allen V. Astin Award