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Projects/Programs

Displaying 1 - 15 of 15

Earth Energy Budget

Ongoing
The goal of this project is to extend and improve the measurements of the key climate record of the long-term balance between Earth absorption of solar energy

Fiber-optic Frequency Comb Development

Ongoing
To support comb-based measurements outside the metrology laboratory, we develop high performance, robust frequency combs based on fiber-optic technology.

GaN Nanowire Growth

Ongoing
GaN nanowires grown by catalyst-free molecular beam epitaxy have the unique property that most nanowires are completely free of crystalline defects. This

GaN Nanowire Metrology and Applications

Ongoing
We synthesize semiconductor nanostructures to serve both as test structures for measurement techniques and as building blocks for novel metrology tools and

High-Power Laser Applications

Ongoing
High-power continuous wave lasers have output powers from tens of watts to hundreds of kilowatts. Their applications are anywhere localized delivery of high

Nanostructure Fabrication and Metrology

Completed
Single photons are the fundamental particles for all optical measurements. Single photon detectors made from avalanche photodiodes or photomultiplier tubes are

Photonic Radiometry

Ongoing
Accurate characterization of photonic equipment is important for optical communications, medical devices, semiconductor lithography, manufacturing and materials

Quantum Radiometry

Ongoing
The goal of this project is to develop single photon source and detector measurement and calibration capabilities to support the emerging quantum industry and

Super-Continuum Laser Solar Simulator

Completed
This research leverages a new laser technology, the super-continuum laser, to produce a programmable solar simulator that can rapidly configure to match nearly

Terahertz Imaging and Sources

Ongoing
Imaging in the terahertz frequency range enables the detection of concealed weapons and other contraband (e.g., explosives under clothing) without the use of

Waveform Metrology Project

Ongoing
The Waveform Metrology Project provides measurement and algorithmic support for waveform traceability to the optics and high-frequency electronics industries