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Electronics

Electromagnetics

News and Updates

anyon teaser image

Anyone for Anyons?

Researchers have demonstrated that a strange type of quantum particle called the anyon, believed to exist in only two dimensions, can also be created in one

Events

Projects and Programs

Advanced Materials Metrology

Ongoing
Electromagnetic devices cannot operate without the interaction of electromagnetic waves with materials, and the characterization of the interface between fields and materials will be a critical task for any device or metrology development from nanoscale to larger scales. Areas of impact over the
Micrographs of kinetic inductance-based parametric amplifier

Amplifiers

Ongoing
We have developed parametric amplifiers based on two different technologies: Josephson Junctions and superconductors with high kinetic inductance, a representation of the kinetic energy of superconducting Cooper-pair charge carriers. Junction-based parametric amplifiers (JPAs) are well suited for
The NIST millimeter-wave extrapolation range being prepared for antenna measurements.

Antenna Metrology Project

Ongoing
NIST CTL’s Antenna Metrology Project combines theoretical models, analytical tools, and custom-developed facilities to advance the field of antenna measurement and share those advances with industry, government, and academic users. Two generations ago, NIST pioneered the near-field scanning
EUV graphs

Dynamic EUV Imaging and Spectroscopy for Microelectronics

Ongoing
Collaborations with industry leaders have led us to develop new measurement techniques to improve our understanding thermal transport, spin transport, and nanoscopic (and interfacial) material properties in active device structures. Such capability requires the ability to measure these properties at

Publications

Glass microwave microfluidic devices for broadband characterization of diverse fluids

Author(s)
Jacob Pawlik, Tomasz Karpisz, Yasaman Kazemipour, Nicholas Derimow, Sarah Evans, Bryan Bosworth, Christian Long, Nathan Orloff, James Booth, Angela Stelson
We demonstrate a glass microwave microfluidic device for determining the permittivity of a wide range of liquid chemicals from 100 MHz to 10 GHz with relatively

Software

On-Wafer Calibration Software

NIST Microwave Uncertainty Framework (Beta version) The NIST Microwave Uncertainty Framework provides a "drag-and-drop" toolkit for managing the calculation of

Tools and Instruments

Large Aperture Scanner

Large Aperture Scanner

The Large Aperture Scanner (LAS) scans a radar transceiver over a 5 meter by 20 meter aperture. Image reconstruction techniques enable a three-dimensional
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