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Electronics

Flexible electronics

News and Updates

Opposite sides of a quartz crystal resonator

Universe in the Balance

Researchers at the National Institute of Standards and Technology (NIST) have found a way to link measurements made by a device integral to microchip

Projects and Programs

SRM 3452 certified Seebeck coefficient data

Transport Property Measurements for Semiconductors and Energy Materials

Ongoing
The properties of materials and interfaces that govern reliability, performance, and thermal transport in advanced microelectronic packages are not fully characterized or understood, especially at device length scales wherein properties may differ significantly from bulk or literature values
subnanoscale electron microscopy figure

Sub-nanoscale electron microscopy of complex nanostructures

Ongoing
The properties of advance materials are becoming ever more reliant on the ability to manipulate their chemistry and structure at very fine length scales. For example, the relevant feature sizes in state-of-the-art transistors continue to decrease, even as the complexity of the architectures employed
2D Material Electronic Test

Electronic Material Characterization

Ongoing
Manufacturing optimized devices that incorporate newly-emerging materials requires predictable performance throughout device lifetimes. Unexpected degradation in device performance, sometimes leading to failure, is often traceable to poor material reliability. Reliability is rooted in the stability

Publications

Fast Near-Infrared Photodetection using III-V Colloidal Quantum Dots

Author(s)
Lee J. Richter, Bin Sun, Amin M. Najarian, Chao Zheng, Laxmi K. Sagar, Min-Jae Choi, Xiyan Li, Larissa Levina, Se-Woong Baek, Seungjin Lee, Ahmad R. Kirmani, Jehad Abed, Mengxia Liu, Peicheng Li, Oleksandr Voznyy, Zheng H. Lu, F. Pelayo G. de Arquer, Edward H. Sargent
Colloidal quantum dots (CQDs) are promising materials for IR light detection due to their tunable bandgap and their solution processing; however, to date, the

Tools and Instruments

Nanocalorimeter Measurement System

Nanocalorimeter Measurement System

This Nanocalorimeter Measurement System is used for nanocalorimetry measurements at fast heating rates (100 °C/s to 100,000 °C/s) and measurements of samples