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Projects/Programs

Displaying 1 - 5 of 5

Electronic Material Characterization

Ongoing
Manufacturing optimized devices that incorporate newly-emerging materials requires predictable performance throughout device lifetimes. Unexpected degradation in device performance, sometimes leading to failure, is often traceable to poor material reliability. Reliability is rooted in the stability...

Sub-nanoscale electron microscopy of complex nanostructures

Ongoing
The properties of advance materials are becoming ever more reliant on the ability to manipulate their chemistry and structure at very fine length scales. For example, the relevant feature sizes in state-of-the-art transistors continue to decrease, even as the complexity of the architectures employed...

Transport Property Measurements for Semiconductors and Energy Materials

Ongoing
The image above is an exploded cross section diagram representing the simplified structure layers in a MOSFET transistor. Thermoreflectance (TR) laser-based measurement techniques, a key focus of this project, can measure the thermal properties of substrates, thin films, multilayer structures, and...
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