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Projects/Programs

    Displaying 1 - 5 of 5

    Electronic Material Characterization

    Ongoing
    Manufacturing optimized devices that incorporate newly-emerging materials requires predictable performance throughout device lifetimes. Unexpected degradation in device performance, sometimes leading to failure, is often traceable to poor material reliability. Reliability is rooted in the stability

    Sub-nanoscale electron microscopy of complex nanostructures

    Ongoing
    The properties of advance materials are becoming ever more reliant on the ability to manipulate their chemistry and structure at very fine length scales. For example, the relevant feature sizes in state-of-the-art transistors continue to decrease, even as the complexity of the architectures employed

    Transport Property Measurements for Semiconductors and Energy Materials

    Ongoing
    The properties of materials and interfaces that govern reliability, performance, and thermal transport in advanced microelectronic packages are not fully characterized or understood, especially at device length scales wherein properties may differ significantly from bulk or literature values