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Terminology for High-Speed Sampling-Oscilloscope Calibration

Published

Author(s)

Dylan Williams, Tracy S. Clement, Paul D. Hale, Andrew Dienstfrey

Abstract

We discuss procedures for calibrating high-speed sampling oscilloscopes at the National Institute of Standards and Technology, and the terminology associated with those calibrations. The discussion clarifies not only the calibration procedures, but how to use the calibrations to perform traceable oscilloscope measurements.
Proceedings Title
ARFTG Microwave Measurement Conference Digest
Conference Dates
November 30, 2006-December 1, 2007
Conference Location
Boulder, CO, USA
Conference Title
ARFTG Microwave Measurement Conference

Keywords

calibration, impedance mismatch, mismatch correction, sampling oscilloscope, terminology

Citation

Williams, D. , Clement, T. , Hale, P. and Dienstfrey, A. (2006), Terminology for High-Speed Sampling-Oscilloscope Calibration, ARFTG Microwave Measurement Conference Digest, Boulder, CO, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32316 (Accessed December 2, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 30, 2006, Updated October 12, 2021