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Sampling Oscilloscope Models and Calibrations

Published

Author(s)

Kate Remley, Dylan Williams

Abstract

We discuss the basic principles of operation of electrical sampling oscilloscopes and describe circuit models developed to design, characterize, and help explain their operation. We survey common oscilloscope calibration schemes that correct for finite oscilloscope impulse response, distortion and jitter in the oscilloscope time base, and impedance mismatches.
Volume
3
Conference Dates
June 8-13, 2003
Conference Location
Philadelphia, PA, USA
Conference Title
2003 IEEE International Microwave Symposium

Keywords

Impulse response, mismatch correction, oscilloscope model, sampler, sampling oscilloscope, sampling-circuit model, SPICE, time-base distortion.

Citation

Remley, K. and Williams, D. (2003), Sampling Oscilloscope Models and Calibrations, 2003 IEEE International Microwave Symposium, Philadelphia, PA, USA, [online], https://doi.org/10.1109/MWSYM.2003.1210422, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31272 (Accessed May 22, 2022)
Created June 16, 2003, Updated October 12, 2021