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Accurate Experimental Characterization of On-Chip Interconnects

Published

Author(s)

Dylan F. Williams, Uwe A. Hartmut Grabinski

Abstract

In this paper we examine different approaches to the extraction of frequency dependent line parameters from broadband S-parameter measurements.
Proceedings Title
1999 URSI General Assembly
Conference Dates
August 13-21, 1999
Conference Location
Toronto

Citation

Williams, D. and Hartmut, U. (1999), Accurate Experimental Characterization of On-Chip Interconnects, 1999 URSI General Assembly, Toronto, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920443 (Accessed June 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 13, 1999, Updated February 19, 2017