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Electrical Measurements for Electronic Interconnections at NIST



Dylan Williams, Donald C. DeGroot


The National Institute of Standards and Technology (NIST) operates a number of research projects to advance measurement science and technology for the microelectronic industry. Here we will summarize (1), report on one component of the NIST program, the fundamental electrical characterization of electronic interconnections through accurate measurement.
Proceedings Title
Proc., URSI General Assembly
Conference Dates
August 13-21, 1999
Conference Location
Toronto, 1, CA


electronic packaging, interconnections, measurements, network analysis


Williams, D. and DeGroot, D. (1999), Electrical Measurements for Electronic Interconnections at NIST, Proc., URSI General Assembly, Toronto, 1, CA, [online], (Accessed June 14, 2024)


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Created July 31, 1999, Updated October 12, 2021