Williams, D.
and DeGroot, D.
(1999),
Electrical Measurements for Electronic Interconnections at NIST, Proc., URSI General Assembly, Toronto, 1, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=7260
(Accessed December 12, 2024)
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Electrical Measurements for Electronic Interconnections at NIST
Published
Author(s)
,
Abstract
The National Institute of Standards and Technology (NIST) operates a number of research projects to advance measurement science and technology for the microelectronic industry. Here we will summarize (1), report on one component of the NIST program, the fundamental electrical characterization of electronic interconnections through accurate measurement.Proceedings Title
Proc., URSI General Assembly
Conference Dates
August 13-21, 1999
Conference Location
Toronto, 1, CA
Pub Type
Conferences
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Keywords
electronic packaging, interconnections, measurements, network analysis
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 31, 1999, Updated October 12, 2021