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Electrical Measurements for Electronic Interconnections at NIST

Published

Author(s)

Dylan Williams, Donald C. DeGroot

Abstract

The National Institute of Standards and Technology (NIST) operates a number of research projects to advance measurement science and technology for the microelectronic industry. Here we will summarize (1), report on one component of the NIST program, the fundamental electrical characterization of electronic interconnections through accurate measurement.
Proceedings Title
Proc., URSI General Assembly
Conference Dates
August 13-21, 1999
Conference Location
Toronto, 1, CA

Keywords

electronic packaging, interconnections, measurements, network analysis

Citation

Williams, D. and DeGroot, D. (1999), Electrical Measurements for Electronic Interconnections at NIST, Proc., URSI General Assembly, Toronto, 1, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=7260 (Accessed June 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 31, 1999, Updated October 12, 2021