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Calibrated Waveform Measurement with High-Impedance Probes

Published

Author(s)

Pavel Kabos, Howard C. Reader, Uwe Arz, Dylan Williams

Abstract

We develop an on-wafer waveform calibration technique that combines frequency-domain mismatch corrections to account for the effects of the probe on the measurement with an oscilloscope calibration. The mismatch correction is general and can be applied to any type of microwave probe, including scanning and internal-node probes for noninvasive integrated-circuit test. We show that, for the commercial high-impedance probe we used, this calibration approach allows accurate on-wafer waveform reconstruction for a variety of probe ground configurations.
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
51
Issue
2

Keywords

calibration, high-impedance probe, on-wafer measurement, waveform measurement

Citation

Kabos, P. , Reader, H. , Arz, U. and Williams, D. (2003), Calibrated Waveform Measurement with High-Impedance Probes, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/TMTT.2002.807842 (Accessed December 14, 2024)

Issues

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Created January 31, 2003, Updated October 12, 2021