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A Prescription for Sub-Millimeter-Wave Transistor Characterization

Published

Author(s)

Dylan F. Williams, Adam C. Young, Urteaga Miguel

Abstract

We present an approach for characterizing transistors embedded in microstrip lines formed on a thin bisbenzocyclobutene-based (BCB) monomers film at sub-millimeter-wave frequencies. We demonstrate the approach to 750 GHz and estimate the uncertainty of the procedure.
Citation
IEEE Transactions on Terahertz Science and Technology
Volume
3
Issue
4

Keywords

BCB, bisbenzocyclobutene-based monomers, calibration, scattering parameters, sub-millimeter-wave, transistor, uncertainty, vector network analyzer

Citation

Williams, D. , Young, A. and Miguel, U. (2013), A Prescription for Sub-Millimeter-Wave Transistor Characterization, IEEE Transactions on Terahertz Science and Technology, [online], https://doi.org/10.1109/TTHZ.2013.2255332 (Accessed February 24, 2024)
Created July 1, 2013, Updated January 27, 2020