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Accurate Transmission Line Characterization

Published

Author(s)

Dylan F. Williams, Roger Marks

Abstract

This letter introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance, and conductance per unit length of coplanar waveguide transmission lines fabricated on lossy silicon substrates.
Citation
IEEE Microwave and Guided Wave Letters
Volume
3
Issue
8

Citation

Williams, D. and Marks, R. (1993), Accurate Transmission Line Characterization, IEEE Microwave and Guided Wave Letters, [online], https://doi.org/10.1109/75.242226 (Accessed July 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 1, 1993, Updated November 10, 2018