Williams, D.
and Walker, D.
(1998),
In-Line Multiport Calibration Algorithm, Tech Dig., Auto. RF Tech. Group Conf., Baltimore, MD, [online], https://doi.org/10.1109/ARFTG.1998.327284
(Accessed May 21, 2025)
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In-Line Multiport Calibration Algorithm
Published
Author(s)
,
Abstract
We present a multiport measurement procedure well suited to on-wafer measurement. It can correct multiport measurements with any conventional in-line calibration, including the thru-reflect-line calibration. We demonstrate the procedure in a four-port measurement system.Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Conference Dates
June 7-12, 1998
Conference Location
Baltimore, MD
Pub Type
Conferences
Download Paper
Keywords
electrical impedance standard, on-wafer calibration, wafer probes
Citation
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Created June 1, 1998, Updated November 10, 2018