Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Embedded multiconductor transmission line characterization



Dylan F. Williams


This paper presents a measurement method that characterizes lossy printed multiconductor transmission lies embedded in transitions, connectors, or packages with significant electrical parasitics. We test the method on a pair of lossy coupled asymmetric microstrip lies and compare to previous results.
Proceedings Title
IEEE MTT-S International Microwave Symposium Digest, 1997
Conference Dates
June 8-13, 1997
Conference Location
Denver, CO


Williams, D. (1997), Embedded multiconductor transmission line characterization, IEEE MTT-S International Microwave Symposium Digest, 1997, Denver, CO, [online], (Accessed June 14, 2024)


If you have any questions about this publication or are having problems accessing it, please contact

Created June 8, 1997, Updated November 10, 2018