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Multi-Frequency Approach to Vector-Network-Analyzer Scattering-Parameter Measurements

Published

Author(s)

Arkadiusz C. Lewandowski, Dylan F. Williams, Wojciech Wiatr

Abstract

We present a multi-frequency approach to vector-network-analyzer scattering-parameter measurements. This novel approach accounts for the relationships between the measurements at different frequencies, and thus breaks with the traditional paradigm to vector-network-analyzer scattering-parameter measurements, in which the measurements are carried out independently at each frequency. We review the theoretical foundations of the multi-frequency approach and show that it leads to a significant reduction of the measurement uncertainty and its more complete description.
Proceedings Title
European Microwave Conference
Conference Dates
September 26-October 1, 2010
Conference Location
Paris
Conference Title

Citation

Lewandowski, A. , Williams, D. and Wiatr, W. (2010), Multi-Frequency Approach to Vector-Network-Analyzer Scattering-Parameter Measurements, European Microwave Conference, Paris, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905808 (Accessed April 20, 2024)
Created September 28, 2010, Updated February 19, 2017