Williams, D.
and Marks, R.
(1995),
LRM Probe-Tip Calibrations Using Nonideal Standards, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/22.348112
(Accessed May 21, 2025)
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LRM Probe-Tip Calibrations Using Nonideal Standards
Published
Author(s)
,
Abstract
The line-reflect-match calibration is enhanced to accommodate imperfect match standards and lossy lines typical of monolithic microwave integrated circuits. We characterize the match and line standards using an additional line standard of moderate length. The new method provides a practical means of obtaining accurate, wideband calibrations with compact standard sets. Without the enhancement, calibration errors due to imperfections in typical standards can be severe.Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
43
Issue
2
Pub Type
Journals
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Created February 1, 1995, Updated November 10, 2018