Williams, D.
and Miers, T.
(1988),
De-embedding Coplanar Probes with Planar Distributed Standards, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/22.17426 (Accessed April 24, 2026)
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De-embedding Coplanar Probes with Planar Distributed Standards
Published
Author(s)
, Tom H. Miers
Abstract
Two methods are used to de-embed coplanar probes using offset coplanar waveguide shorts and transmission lines. The accuracy of the de-embedded measurements is verified. The S parameters of lumped standards provided by the manufacturer of the probes are measured and found to be suitable for purposes of calibration up to 26 GHz.Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
36
Issue
12
Pub Type
Journals
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Created December 1, 1988, Updated November 10, 2018