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De-embedding and unterminating microwave fixtures with nonlinear least squares

Published

Author(s)

Dylan F. Williams

Abstract

This paper investigates a general method of characterizing microwave test fixtures for the purpose of determining the S parameters of devices embedded in the fixture. The accuracy of the technique was studied and compared with that of the common open-short-load and thru-reflect-line methods. Increased accuracy was obtained using redundant measurements.
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
38
Issue
6

Citation

Williams, D. (1990), De-embedding and unterminating microwave fixtures with nonlinear least squares, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/22.130977 (Accessed April 16, 2024)
Created June 1, 1990, Updated November 10, 2018