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Calibrating Electro-Optic Sampling Systems

Published

Author(s)

Dylan Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan

Abstract

We apply frequency-domain impedance mismatch corrections to a temporal electro-optic sampling system. We identify and evaluate additional sources of measurement uncertainty. We use the system to characterize the magnitude and phase response of a photoreceiver that is physically far removed from the point where the voltage waveforms are measured.
Proceedings Title
Dig., IEEE Microwave Theory Tech. Intl. Symp.
Volume
3
Conference Dates
May 20-25, 2001
Conference Location
Phoenix, AZ, USA

Keywords

electro-optic sampling, mismatch correction, optical detectors, waveform measurement

Citation

Williams, D. , Hale, P. , Clement, T. and Morgan, J. (2001), Calibrating Electro-Optic Sampling Systems, Dig., IEEE Microwave Theory Tech. Intl. Symp., Phoenix, AZ, USA, [online], https://doi.org/10.1109/MWSYM.2001.967193, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=25110 (Accessed February 29, 2024)
Created April 30, 2001, Updated October 12, 2021