Traceability of high-speed electrical waveforms at NIST, NPL, and PTB

Published

July 6, 2012

Author(s)

Paul D. Hale, Dylan F. Williams, Andrew M. Dienstfrey, Chih-Ming Wang, Jeffrey A. Jargon, David Humphreys, Matthew Harper, Heiko Fuser, Mark Bieler

Abstract

Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-optic sampling that can be used to establish a traceable calibration chain between high-speed waveform measurements and the SI. These services are increasingly switching to a full waveform metrology paradigm, obtaining an estimate of the central value and associated uncertainty of the entire waveform as a function of time.

Proceedings Title

Conference on Precision Electromagnetic Measurements

Conference Dates

July 1-6, 2012

Conference Location

Washington, DC

Pub Type

Conferences

Download Paper

https://doi.org/10.1109/CPEM.2012.6251033

Keywords

Electro-optic sampling, metrology, oscilloscope, photodetector, pulse, ultrafast, uncertainty, waveform

Citation

Hale, P. , Williams, D. , Dienstfrey, A. , Wang, C. , Jargon, J. , Humphreys, D. , Harper, M. , Fuser, H. and Bieler, M. (2012), Traceability of high-speed electrical waveforms at NIST, NPL, and PTB, Conference on Precision Electromagnetic Measurements, Washington, DC, [online], https://doi.org/10.1109/CPEM.2012.6251033 (Accessed October 20, 2025)