Williams, D.
, Belquin, J.
, Dambrine, G.
and Fenton, R.
(1996),
On-Wafer Measurement at Millimeter Wave Frequencies, Tech. Dig., IEEE MTT-S International Microwave Symposium, San Francisco, CA, [online], https://doi.org/10.1109/MWSYM.1996.512264
(Accessed December 8, 2024)
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On-Wafer Measurement at Millimeter Wave Frequencies
Published
Author(s)
, J. M. Belquin, G. Dambrine, R. Fenton
Abstract
We investigate millimeter wave on-wafer calibration and measurement in coplanar waveguide and demonstrate the applicability of the multiline thru-reflect-line calibration and good measurement repeatability between laboratories. We also investigate calibrations in conductor-backed coplanar waveguide.Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Volume
3
Conference Dates
June 17-21, 1996
Conference Location
San Francisco, CA
Pub Type
Conferences
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Citation
Issues
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Created June 1, 1996, Updated November 10, 2018