On-Wafer Measurement at Millimeter Wave Frequencies
Dylan F. Williams, J. M. Belquin, G. Dambrine, R. Fenton
We investigate millimeter wave on-wafer calibration and measurement in coplanar waveguide and demonstrate the applicability of the multiline thru-reflect-line calibration and good measurement repeatability between laboratories. We also investigate calibrations in conductor-backed coplanar waveguide.
Tech. Dig., IEEE MTT-S International Microwave Symposium
, Belquin, J.
, Dambrine, G.
and Fenton, R.
On-Wafer Measurement at Millimeter Wave Frequencies, Tech. Dig., IEEE MTT-S International Microwave Symposium, San Francisco, CA, [online], https://doi.org/10.1109/MWSYM.1996.512264
(Accessed December 8, 2023)