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Establishing Traceability of an Electronic Calibration Unit Using the NIST Microwave Uncertainty Framework

Published

Author(s)

Jeffrey A. Jargon, Dylan F. Williams, Thomas M. Wallis, Denis X. LeGolvan, Paul D. Hale

Abstract

We present a method for providing traceability to a commercial electronic calibration unit for vector network analyzers by characterizing its scattering parameters with repeated multiline thru-reflect-line (TRL) calibrations and utilizing the NIST Microwave Uncertainty Framework to propagate uncertainties. With the electronic calibration unit characterized, we use it to calibrate a network analyzer, and characterize a number of verification devices with corresponding uncertainties. We also calibrate the same verification devices using one of the previous multiline TRL calibrations, and compare results.
Proceedings Title
ARFTG 79th Microwave Measurement Conference
Conference Dates
June 22, 2012
Conference Location
Montreal

Keywords

electronic calibration unit, traceability, uncertainty, vector network analyzer

Citation

Jargon, J. , Williams, D. , Wallis, T. , LeGolvan, D. and Hale, P. (2012), Establishing Traceability of an Electronic Calibration Unit Using the NIST Microwave Uncertainty Framework, ARFTG 79th Microwave Measurement Conference, Montreal, -1, [online], https://doi.org/10.1109/ARFTG79.2012.6291181 (Accessed April 14, 2024)
Created June 22, 2012, Updated November 10, 2018