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An Optimal Multiline TRL Calibration Algorithm

Published

Author(s)

Dylan Williams, Jack Wang, Uwe Arz

Abstract

We examine the performance of two on-wafer multiline TRL calibration algorithms, the popular multiline TRL algorithm implemented in the MultiCal software package and a newly implemented iterative algorithm designed to give optimal results in the presence of measurement noise. We show that the iterative algorithm outperforms the MultiCal software in the presence of measurement noise and verify its uncertainty estimates.
Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Volume
3
Conference Dates
June 9-12, 2003
Conference Location
Philadelphia, PA, USA
Conference Title
International Microwave Symposium

Keywords

calibration, microwave, scattering parameters, thru-reflect-line, vector network analyzer

Citation

Williams, D. , Wang, J. and Arz, U. (2003), An Optimal Multiline TRL Calibration Algorithm, Tech. Dig., IEEE MTT-S International Microwave Symposium, Philadelphia, PA, USA, [online], https://doi.org/10.1109/MWSYM.2003.1210494, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30908 (Accessed June 14, 2024)

Issues

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Created June 16, 2003, Updated October 12, 2021