We examine the performance of two on-wafer multiline TRL calibration algorithms, the popular multiline TRL algorithm implemented in the MultiCal software package and a newly implemented iterative algorithm designed to give optimal results in the presence of measurement noise. We show that the iterative algorithm outperforms the MultiCal software in the presence of measurement noise and verify its uncertainty estimates.
Tech. Dig., IEEE MTT-S International Microwave Symposium
, Wang, J.
and Arz, U.
An Optimal Multiline TRL Calibration Algorithm, Tech. Dig., IEEE MTT-S International Microwave Symposium, Philadelphia, PA, [online], https://doi.org/10.1109/MWSYM.2003.1210494
(Accessed September 22, 2021)