NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Compensation for Substrate Permittivity in Probe-Tip Calibration

Published

Author(s)

Dylan F. Williams, Roger Marks

Abstract

We demonstrate a method of compensation for the effect of substrate permittivity on coplanar waveguide probe-tip scattering parameter calibrations, modeling the effect as a capacitance at the probe tip. Comparison to on-wafer multiline TRL calibration verifies its accuracy. The method allows calibration to the probe tip using generic off-wafer standards with accuracy comparable to that of on-wafer calibration.
Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Volume
26
Conference Dates
December 1-2, 1994
Conference Location
Boulder, CO
Pub Type
Conferences

Download Paper

https://doi.org/10.1109/ARFTG.1994.327077
Electromagnetics

Citation

Williams, D. and Marks, R. (1994), Compensation for Substrate Permittivity in Probe-Tip Calibration, Tech Dig., Auto. RF Tech. Group Conf., Boulder, CO, [online], https://doi.org/10.1109/ARFTG.1994.327077 (Accessed October 18, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 1, 1994, Updated November 10, 2018
Was this page helpful?