Marks, R.
and Williams, D.
(1991),
Reciprocity Relations for On-Wafer Power Measurements, Tech Dig., Auto. RF Tech. Group Conf., San Diego, CA, [online], https://doi.org/10.1109/ARFTG.1991.324041 (Accessed April 24, 2026)
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Reciprocity Relations for On-Wafer Power Measurements
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Abstract
The implications of expressions relating the forward and reverse transmission coefficients of a waveguide junction derived from the Lorentz reciprocity condition are explored. The two terms in the relation, the phase of the reference impedance in the guide and a new reciprocity factor, lead to an asymmetric scattering parameter matrix when one of the transmission lines connected to the junction is lossy.Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Volume
20
Conference Dates
December 5-6, 1991
Conference Location
San Diego, CA
Pub Type
Conferences
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Created December 5, 1991, Updated November 10, 2018