Wideband Frequency-Domain Characterization of High-Impedance Probes
Uwe Arz, Howard C. Reader, Pavel Kabos, Dylan F. Williams
In this paper we investigate the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization, both of which yield equivalent results.
, Reader, H.
, Kabos, P.
and Williams, D.
Wideband Frequency-Domain Characterization of High-Impedance Probes, 58th Auto. RF Tech. Group Conference, San Diego, CA, [online], https://doi.org/10.1109/ARFTG.2001.327491
(Accessed December 5, 2023)