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Comparison of SOLR and TRL Calibrations

Published

Author(s)

Dave K. Walker, Dylan F. Williams

Abstract

We examine a short-open-load-reciprocal scattering parameter calibration in both in-line and orthogonal probe configurations. We explore its standard definitions and verify its accuracy by comparing it to a multiline thru-reflect-line calibration.
Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Volume
33
Conference Dates
June 7-12, 1998
Conference Location
Baltimore, MD

Keywords

electrical imedance standard, on-wafer calibration, wafer probes

Citation

Walker, D. and Williams, D. (1998), Comparison of SOLR and TRL Calibrations, Tech Dig., Auto. RF Tech. Group Conf., Baltimore, MD, [online], https://doi.org/10.1109/ARFTG.1998.327283 (Accessed July 17, 2024)

Issues

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Created June 1, 1998, Updated November 10, 2018