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Uncertainty of the NIST Electrooptic Sampling System

Published

Author(s)

Dylan F. Williams, Paul D. Hale, Tracy S. Clement

Abstract

We present an uncertainty analysis of measurements performed with NIST's electrooptic sampling system. The system measures the voltage waveform injected by a photodetector on a coplanar waveguide fabricated on an electrooptic LiTaO3 wafer. The frequency response of the photodetector is determined from the voltage measured launched into the coplanar waveguide with a microwave wafer probe. A series of mismatch corrections account for the effects of the probe and coplanar waveguide.
Citation
Technical Note (NIST TN) - 1535
Report Number
1535

Keywords

electrical phase, electrooptic sampling, mismatch correction, photodetector calibration, photodiode calibration

Citation

Williams, D. , Hale, P. and Clement, T. (2004), Uncertainty of the NIST Electrooptic Sampling System, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31712 (Accessed July 19, 2024)

Issues

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Created December 1, 2004, Updated January 27, 2020