Williams, D.
, Hale, P.
and Clement, T.
(2004),
Uncertainty of the NIST Electrooptic Sampling System, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31712
(Accessed April 23, 2024)
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Uncertainty of the NIST Electrooptic Sampling System
Published
Author(s)
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Abstract
We present an uncertainty analysis of measurements performed with NIST's electrooptic sampling system. The system measures the voltage waveform injected by a photodetector on a coplanar waveguide fabricated on an electrooptic LiTaO3 wafer. The frequency response of the photodetector is determined from the voltage measured launched into the coplanar waveguide with a microwave wafer probe. A series of mismatch corrections account for the effects of the probe and coplanar waveguide.Citation
Technical Note (NIST TN) - 1535
Report Number
1535
NIST Pub Series
Pub Type
NIST Pubs
Download Paper
Keywords
electrical phase, electrooptic sampling, mismatch correction, photodetector calibration, photodiode calibration
Citation
Created December 1, 2004, Updated January 27, 2020