Williams, D.
, Hale, P.
and Clement, T.
(2004),
Uncertainty of the NIST Electrooptic Sampling System, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31712
(Accessed December 2, 2024)
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Uncertainty of the NIST Electrooptic Sampling System
Published
Author(s)
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Abstract
We present an uncertainty analysis of measurements performed with NIST's electrooptic sampling system. The system measures the voltage waveform injected by a photodetector on a coplanar waveguide fabricated on an electrooptic LiTaO3 wafer. The frequency response of the photodetector is determined from the voltage measured launched into the coplanar waveguide with a microwave wafer probe. A series of mismatch corrections account for the effects of the probe and coplanar waveguide.Citation
Technical Note (NIST TN) - 1535
Report Number
1535
NIST Pub Series
Pub Type
NIST Pubs
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Keywords
electrical phase, electrooptic sampling, mismatch correction, photodetector calibration, photodiode calibration
Citation
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Created December 1, 2004, Updated January 27, 2020