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Radiation, Multimode Propagation, and Substrate Modes in W-Band CPW Calibrations

Published

Author(s)

Dylan F. Williams, Franz-Joseph Schmuckle, Ralf Dorner, G.N. Phung, Wolfgang Heinrich, Uwe Arz

Abstract

We investigate the degradation of the accuracy of coplanar waveguide calibration standards at higher frequencies due to multi-mode propagation, substrate modes, and radiation. Based on a typical calibration substrate, we investigate these effects and their impact on vector-network-analyzer calibrations at W-band.
Proceedings Title
European Microwave Week
Conference Dates
October 9-14, 2011
Conference Location
Manchester
Conference Title
The European Microwave Conference

Keywords

calibration, CPW, em simulation, on-wafer, measurements

Citation

Williams, D. , Schmuckle, F. , Dorner, R. , Phung, G. , Heinrich, W. and Arz, U. (2011), Radiation, Multimode Propagation, and Substrate Modes in W-Band CPW Calibrations, European Microwave Week, Manchester, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907946 (Accessed April 22, 2024)
Created October 10, 2011, Updated January 27, 2020