NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Accurate Characteristic Impedance Measurement on Silicon

Published

Author(s)

Dylan F. Williams, Uwe Arz, Hartmut Grabinski

Abstract

This paper presents a new method that accurately determines the characteristic impedance of planar transmission lines printed on lossy dielectrics even when contact-pad capacitance and conductance are large. We demonstrate the method on a coplanar waveguide fabricated on fused silica and a microstrip line fabricated on a highly conductive silicon substrate.
Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Volume
3
Conference Dates
June 7-12, 1998
Conference Location
Baltimore, MD
Pub Type
Conferences

Download Paper

https://doi.org/10.1109/MWSYM.1998.700955

Citation

Williams, D. , Arz, U. and Grabinski, H. (1998), Accurate Characteristic Impedance Measurement on Silicon, Tech. Dig., IEEE MTT-S International Microwave Symposium, Baltimore, MD, [online], https://doi.org/10.1109/MWSYM.1998.700955 (Accessed October 16, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created June 1, 1998, Updated November 10, 2018
Was this page helpful?