TY  - CONF
AU  - Dylan Williams
AU  - Uwe Arz
AU  - Hartmut Grabinski
C2  - Tech. Dig.,   IEEE MTT-S International Microwave Symposium, Baltimore, MD
DA  - 1998-06-01
DO  - https://doi.org/10.1109/MWSYM.1998.700955
LA  - en
M1  - 3
PB  - Tech. Dig.,   IEEE MTT-S International Microwave Symposium, Baltimore, MD
PY  - 1998
TI  - Accurate Characteristic Impedance Measurement on Silicon
ER  -