Effects of Nonlinear Diode Junction Capacitance on the Nose-to-Nose Calibration

Catherine A. Remley; Dylan F. Williams; Donald C. DeGroot; Jan  Verspecht; John  Kerley

The .gov means it’s official.
Federal government websites often end in .gov or .mil. Before sharing sensitive information, make sure you’re on a federal government site.

The site is secure.
The https:// ensures that you are connecting to the official website and that any information you provide is encrypted and transmitted securely.

PUBLICATIONS

Effects of Nonlinear Diode Junction Capacitance on the Nose-to-Nose Calibration

Published

May 1, 2001

Author(s)

Catherine A. Remley, Dylan F. Williams, Donald C. DeGroot, Jan Verspecht, John Kerley

Abstract

We examine the effects of nonlinear diode junction capacitance on the fundamental premise of the noise-to-nose calibration, that the kickout is identical in shape to the impulse response of the sampler. We offer a physical explanation for the error introduced by the nonlinear junction capacitance in terms of small-signal diode nist-equations.

Citation

IEEE Microwave and Wireless Components Letters

Volume

Issue

Pub Type

Journals

Download Paper

https://doi.org/10.1109/7260.923026

Keywords

digital sampling, nose-to-nose calibration, oscilloscope, phase error samplers

Electromagnetics

Created May 1, 2001, Updated January 27, 2020