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Calibrated 200 GHz Waveform Measurement

Published

Author(s)

Dylan Williams, Paul D. Hale, Tracy S. Clement

Abstract

We develop a method for mismatch-correcting temporal waveforms measured with a high-speed electro-optic sampling system. The new calibration characterizes the source in both the time and frequency domains, and accounts for all impedances and multiple reflections in the measurement system.
Citation
IEEE Photonics Technology Letters
Volume
53
Issue
4

Keywords

Electro-optic sampling, on-wafer measurement, mismatch correction, temporal waveform measurement

Citation

Williams, D. , Hale, P. and Clement, T. (2005), Calibrated 200 GHz Waveform Measurement, IEEE Photonics Technology Letters, [online], https://doi.org/10.1109/TMTT.2005.845760 (Accessed February 23, 2024)
Created March 31, 2005, Updated October 12, 2021