Dylan F. Williams received a Ph.D. in Electrical Engineering from the University of California, Berkeley in 1986. He joined the Electromagnetic Fields Division of the National Institute of Standards and Technology in 1989 where he develops electrical waveform and microwave metrology. He has published over 80 technical papers and is a Fellow of the IEEE. He is the recipient of the Department of Commerce Bronze and Silver Medals, two Electrical Engineering Laboratory's Outstanding Paper Awards, two Automatic RF Techniques Group (ARFTG) Best Paper Awards, the ARFTG Automated Measurements Technology Award, and the IEEE Morris E. Leeds Award. Dylan is now Editor of the IEEE Transactions on Microwave Theory and Techniques.
Related Programs and Projects
High Speed Waveform Measurement
On-Wafer Measurement Metrology
Metrology for Electronic Packaging