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A Prescription for THz Transistor Characterization

Published

Author(s)

Dylan F. Williams

Abstract

Advances in microwave wafer probes and vector network analyzers have opened up a whole new world of discovery in microwave metrology, making possible accurate on-wafer measurements in printed transmission lines at microwave, millimeter-wave, sub-millimeter-wave, and even terahertz frequencies. Dr. Dylan Williams, winner of the 2013 IEEE Joseph F. Keithley Award in Instrumentation and Measurement, will trace the history of on-wafer measurements, discuss the fundamental principles behind on-wafer measurements and tell you everything you need to know about how to make accurate on-wafer measurements from DC to THz frequencies.
Citation
NIST Website/Electromagnetics Division/High-Speed Electronics

Keywords

microwave measurement, on-wafer measurement, transistor
Created April 4, 2014, Updated November 10, 2018