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Calibrated Measurement of Optoelectronic Frequency Response

Published

Author(s)

Paul D. Hale, Dylan Williams

Abstract

We describe a straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
51
Issue
4

Keywords

frequency response, measurement, optoelectronic devices, scattering matrices

Citation

Hale, P. and Williams, D. (2003), Calibrated Measurement of Optoelectronic Frequency Response, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/TMTT.2003.809186 (Accessed June 17, 2024)

Issues

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Created March 31, 2003, Updated October 12, 2021