Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

National Institute of Standards and Technology Programs in Electrical Measurements for Electronic Interconnections

Published

Author(s)

Donald C. DeGroot, Dylan Williams

Abstract

Abstract: The National Institute of Standards and Technology operates a number of research projects to advance measurement science and technology for the microelectronic industries. We report here on one component of the NIST program, the fundamental electrical characterization of electronic interconnections through accurate measurement. We have developed and continue to develop measurement techniques for fully calibrated time-domain network analysis, lossy transmission lines on silicon, coupled transmission lines, fully calibrated multiport network analysis, low dielectric constant thin-film materials, and at-speed test.
Proceedings Title
Proc., Electrical Performance of Electronic Packaging.
Conference Dates
October 26-28, 1998
Conference Location
West Point, NY, US
Conference Title
Electrical Performance of Electronic Packaging, 1998. IEEE 7th Topical Meeting on

Citation

DeGroot, D. and Williams, D. (1998), National Institute of Standards and Technology Programs in Electrical Measurements for Electronic Interconnections, Proc., Electrical Performance of Electronic Packaging., West Point, NY, US, [online], https://doi.org/10.1109/EPEP.1998.733747, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=7607 (Accessed February 22, 2024)
Created September 30, 1998, Updated October 12, 2021