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Nose-to-Nose Response of a 20-GHz Sampling Circuit

Published

Author(s)

Dylan F. Williams, Catherine A. Remley, Donald C. DeGroot

Abstract

We use SPICE simulations to determine a response function of a two-diode 20-GHz sampling circuit. We explore the validity of the SPICE simulations in a variety of operational conditions and examine differences between the actual response of an impedance-matched sampling circuit and the response function reconstructed by the nose-to-nose calibration procedure.
Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Volume
36
Conference Dates
December 2-3, 1999
Conference Location
Atlanta, GA

Keywords

impulse response, kickout pulse, nose-to-nose calibration, sampling circuit, SPICE simulation

Citation

Williams, D. , Remley, C. and DeGroot, D. (1999), Nose-to-Nose Response of a 20-GHz Sampling Circuit, Tech Dig., Auto. RF Tech. Group Conf., Atlanta, GA, [online], https://doi.org/10.1109/ARFTG.1999.327365 (Accessed May 22, 2022)
Created December 1, 1999, Updated November 10, 2018