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Stochastic Modeling of Coaxial-Connector Repeatability Errors

Published

Author(s)

Arkadiusz C. Lewandowski, Dylan F. Williams

Abstract

We propose a new description of connector or repeatability errors for coaxial one-port devices. Our approach is based on a stochastic model constructed as a luped-element equivalent circuit with randomly varying frequency-independent parameters. We represent statistical properties of these parameters with a covariance matrix which is estimated from a small number of repeated measurements (typically 16) of a one-port device under test. We illustrate our approach by modeling connector repeatability errors for 1.85 mm coaxial offset shorts. These results show that our model is capable of reproducing the complicated frequency-dependent behavior of connector repeatability errors for coaxial one-port devices with typically only two or three random parameters.
Proceedings Title
74th ARFTG Microwave Measurement Symposium System Modeling and Measurement for High Accuracy Verification
Conference Dates
December 1-4, 2009
Conference Location
Broomfield, CO

Keywords

coaxial connector interface, connector repeatability errors, stochastic modeling

Citation

Lewandowski, A. and Williams, D. (2009), Stochastic Modeling of Coaxial-Connector Repeatability Errors, 74th ARFTG Microwave Measurement Symposium System Modeling and Measurement for High Accuracy Verification, Broomfield, CO, [online], https://doi.org/10.1109/ARFTG74.2009.5439104 (Accessed April 14, 2024)
Created November 30, 2009, Updated November 10, 2018