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Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical Ports

Published

Author(s)

Dylan F. Williams

Abstract

We develop a metric to quantify the accuracy with which measured scattering parameters can be cascaded. We use the metric to compare four rectangular-waveguide calibration strategies at sub-millimeter wavelengths that correct for electrical-port imperfections to differing degrees.
Citation
IEEE Transactions on Terahertz Science and Technology
Volume
2
Issue
1

Keywords

Calibration, microwave, millimeter-wave, submillimeter wave, vector network analyzer

Citation

Williams, D. (2012), Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical Ports, IEEE Transactions on Terahertz Science and Technology, [online], https://doi.org/10.1109/TTHZ.2011.2167833 (Accessed June 15, 2024)

Issues

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Created January 1, 2012, Updated January 27, 2020