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Series-Resistor Calibration

Published

Author(s)

Dylan F. Williams, Dave K. Walker

Abstract

We develop a coplanar-waveguide probe-tip scattering parameter calibration based on a thru, a reflect, and an accurately modeled Series resistor. Comparison to a multiline Thru-Reflect-Line calibration verifies the accuracy of the method.
Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Volume
32
Conference Dates
December 4-5, 1997
Conference Location
Portland, OR

Citation

Williams, D. and Walker, D. (1997), Series-Resistor Calibration, Tech Dig., Auto. RF Tech. Group Conf., Portland, OR, [online], https://doi.org/10.1109/ARFTG.1997.327267 (Accessed June 23, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 1, 1997, Updated November 10, 2018