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PUBLICATIONS

Sources of Error in Coplanar-Waveguide TRL Calibrations

Published

Author(s)

Raian K. Kaiser, Dylan F. Williams

Abstract

This paper explores the impact of five sources of systematic error on coplanar waveguide thru-reflect-line calibrations.
Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Volume
36
Conference Dates
December 2-3, 1999
Conference Location
Atlanta, GA
Pub Type
Conferences

Download Paper

https://doi.org/10.1109/ARFTG.1999.327367

Keywords

error analysis, measurement uncertainty, reference impedance, systematic uncertainty

Citation

Kaiser, R. and Williams, D. (1999), Sources of Error in Coplanar-Waveguide TRL Calibrations, Tech Dig., Auto. RF Tech. Group Conf., Atlanta, GA, [online], https://doi.org/10.1109/ARFTG.1999.327367 (Accessed September 17, 2024)

Issues

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Created December 1, 1999, Updated November 10, 2018