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We develop an uncertainty analysis that captures the dominant sources of measurement error in state-of-the-art rectangular-waveguide vector-network-analyzer measurements over the frequency range 500 GHz 750 GHz. We use the analysis to assess thru-reflect-line, thru-short-match, and thru-short-radiating-open calibrations. The comparison shows that thru-short-match and thru- short-radiating-open calibrations outperform thru-reflect-line calibrations, and that this is true even when multiple lines and optimal averaging are used to improve the thru-reflect-line calibrations.
Citation
IEEE Transactions on Microwave Theory and Techniques
Williams, D.
(2011),
500 GHz - 750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/TTHZ.2011.2127370
(Accessed October 18, 2025)