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Interconnection Transmission Line Parameter Characterization

Published

Author(s)

Roger Marks, Dylan Williams

Abstract

This paper introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance, and conductance per unit length of coplanar waveguide transmission lines fabricated on lossy silicon substrates.
Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Volume
22
Conference Dates
December 3-4, 1992
Conference Location
Orlando, FL

Citation

Marks, R. and Williams, D. (1992), Interconnection Transmission Line Parameter Characterization, Tech Dig., Auto. RF Tech. Group Conf., Orlando, FL, [online], https://doi.org/10.1109/ARFTG.1992.327004, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=3071 (Accessed June 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 30, 1992, Updated October 12, 2021