Marks, R.
and Williams, D.
(1992),
Interconnection Transmission Line Parameter Characterization, Tech Dig., Auto. RF Tech. Group Conf., Orlando, FL, [online], https://doi.org/10.1109/ARFTG.1992.327004, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=3071
(Accessed October 9, 2024)
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Interconnection Transmission Line Parameter Characterization
Published
Author(s)
,
Abstract
This paper introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance, and conductance per unit length of coplanar waveguide transmission lines fabricated on lossy silicon substrates.Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Volume
22
Conference Dates
December 3-4, 1992
Conference Location
Orlando, FL
Pub Type
Conferences
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Citation
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Created November 30, 1992, Updated October 12, 2021