Interconnection Transmission Line Parameter Characterization
Roger Marks, Dylan Williams
This paper introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance, and conductance per unit length of coplanar waveguide transmission lines fabricated on lossy silicon substrates.
and Williams, D.
Interconnection Transmission Line Parameter Characterization, Tech Dig., Auto. RF Tech. Group Conf., Orlando, FL, [online], https://doi.org/10.1109/ARFTG.1992.327004, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=3071
(Accessed December 10, 2023)