Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Interconnection Transmission Line Parameter Characterization



Roger Marks, Dylan Williams


This paper introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance, and conductance per unit length of coplanar waveguide transmission lines fabricated on lossy silicon substrates.
Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Conference Dates
December 3-4, 1992
Conference Location
Orlando, FL


Marks, R. and Williams, D. (1992), Interconnection Transmission Line Parameter Characterization, Tech Dig., Auto. RF Tech. Group Conf., Orlando, FL, [online],, (Accessed June 21, 2024)


If you have any questions about this publication or are having problems accessing it, please contact

Created November 30, 1992, Updated October 12, 2021