U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Interconnection Transmission Line Parameter Characterization

Published

Author(s)

Roger Marks, Dylan Williams

Abstract

This paper introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance, and conductance per unit length of coplanar waveguide transmission lines fabricated on lossy silicon substrates.
Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Volume
22
Conference Dates
December 3-4, 1992
Conference Location
Orlando, FL
Pub Type
Conferences

Download Paper

https://doi.org/10.1109/ARFTG.1992.327004
Local Download
Electromagnetics

Citation

Marks, R. and Williams, D. (1992), Interconnection Transmission Line Parameter Characterization, Tech Dig., Auto. RF Tech. Group Conf., Orlando, FL, [online], https://doi.org/10.1109/ARFTG.1992.327004, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=3071 (Accessed April 20, 2024)

Created November 30, 1992, Updated October 12, 2021