Covariance-Based Uncertainty Analysis of the NIST Electrooptic Sampling System

Published

January 1, 2006

Author(s)

Dylan F. Williams, Arkadiusz C. Lewandowski, Tracy S. Clement, C. M. Wang, Paul D. Hale, Juanita M. Morgan, Darryl A. Keenan, Andrew Dienstfrey

Abstract

We develop a covariance matrix describing the uncertainty of mismatch-corrected measurements performed on the National Institute of Standards and Technology's electro-optic sampling system. This description offers a general way of describing the uncertainties of the measurement system in both the temporal and frequency-domains. We illustrate the utility of the approach with several examples, including determining the uncertainty in the temporal voltage generated by the photodiode.

Citation

IEEE Transactions on Microwave Theory and Techniques

Volume

54

Issue

1

Pub Type

Journals

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DOI Link

Keywords

covariance matrix, electro-optic sampling, impulse response, Jacobian, standard uncertainty, uncertainty, uncertainty propagation, variance

Citation

Williams, D. , Lewandowski, A. , Clement, T. , Wang, C. , Hale, P. , Morgan, J. , Keenan, D. and Dienstfrey, A. (2006), Covariance-Based Uncertainty Analysis of the NIST Electrooptic Sampling System, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/TMTT.2005.860492 (Accessed October 19, 2025)