Covariance-Based Uncertainty Analysis of the NIST Electrooptic Sampling System
Dylan F. Williams, Arkadiusz C. Lewandowski, Tracy S. Clement, C. M. Wang, Paul D. Hale, Juanita M. Morgan, Darryl A. Keenan, Andrew Dienstfrey
We develop a covariance matrix describing the uncertainty of mismatch-corrected measurements performed on the National Institute of Standards and Technology's electro-optic sampling system. This description offers a general way of describing the uncertainties of the measurement system in both the temporal and frequency-domains. We illustrate the utility of the approach with several examples, including determining the uncertainty in the temporal voltage generated by the photodiode.
IEEE Transactions on Microwave Theory and Techniques