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Verification of Commercial Probe-Tip Calibrations

Published

Author(s)

Roger Marks, Dylan F. Williams

Abstract

We present results of a verification procedure useful in evaluating the accuracy of probe-tip scattering parameter measurements. The procedure was applied to calibrations and measurements performed in industrial laboratories. Actual measurement discrepancies, due primarily to calibration errors, are directly compared to bounds determined by the comparison method. The results demonstrate the utility of the verification technique as well as serious flaws, particularly at high frequencies, in some conventional calibrations.
Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Volume
24
Conference Dates
December 2-3, 1993
Conference Location
San Jose, CA

Citation

Marks, R. and Williams, D. (1993), Verification of Commercial Probe-Tip Calibrations, Tech Dig., Auto. RF Tech. Group Conf., San Jose, CA, [online], https://doi.org/10.1109/ARFTG.1993.327039 (Accessed June 21, 2024)

Issues

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Created December 1, 1993, Updated November 10, 2018